Kurada; Satya
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kurada; Satya.The latest application filed is for "creating defect samples for array regions".
- Kurada; Satya - Fremont CA
| Patent | Date |
|---|---|
| Creating defect samples for array regions Grant 10,620,134 - Anantha , et al. | 2020-04-14 |
| Creating Defect Samples for Array Regions App 20190346375 - Anantha; Vidyasagar ; et al. | 2019-11-14 |
| Repeater detection Grant 9,766,187 - Chen , et al. September 19, 2 | 2017-09-19 |
| Design Based Sampling and Binning for Yield Critical Defects App 20170103517 - Kurada; Satya ; et al. | 2017-04-13 |
| Based sampling and binning for yield critical defects Grant 9,563,943 - Kurada , et al. February 7, 2 | 2017-02-07 |
| Design Based Sampling and Binning for Yield Critical Defects App 20160225138 - Kurada; Satya ; et al. | 2016-08-04 |
| Based sampling and binning for yield critical defects Grant 9,310,320 - Kurada , et al. April 12, 2 | 2016-04-12 |
| Repeater Detection App 20160061745 - Chen; Hong ; et al. | 2016-03-03 |
| Detecting IC Reliability Defects App 20150120220 - Wu; Joanne ; et al. | 2015-04-30 |
| Design Based Sampling and Binning for Yield Critical Defects App 20140307947 - Kurada; Satya ; et al. | 2014-10-16 |
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