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Patent applications and USPTO patent grants for Kuparinen; Kai.The latest application filed is for "measurement apparatus and method for determining the material composition of a sample by combined x-ray fluorescence analysis and laser-induced breakdown spectroscopy".
Patent | Date |
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Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy Grant 7,233,643 - Sipila , et al. June 19, 2 | 2007-06-19 |
Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy App 20060262900 - Sipila; Heikki Johannes ;   et al. | 2006-11-23 |
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