| Patent | Date |
|---|
Apparatus and methods for integrated MEMS devices
Grant 10,479,676 - Lee , et al. Nov | 2019-11-19 |
Apparatus And Methods For Integrated Mems Devices
App 20180346328 - LEE; Ben ; et al. | 2018-12-06 |
Apparatus and methods for integrated MEMS devices
Grant 10,046,966 - Lee , et al. August 14, 2 | 2018-08-14 |
Dynamic memory structure
Grant 9,935,109 - Lu , et al. April 3, 2 | 2018-04-03 |
Apparatus And Methods For Integrated Mems Devices
App 20170283256 - LEE; Ben ; et al. | 2017-10-05 |
Dynamic Memory Structure
App 20170250185 - Lu; Nicky ; et al. | 2017-08-31 |
Dynamic memory structure
Grant 9,685,449 - Lu , et al. June 20, 2 | 2017-06-20 |
Dynamic Memory Structure
App 20160293607 - Lu; Nicky ; et al. | 2016-10-06 |
Dynamic memory structure
Grant 9,397,103 - Lu , et al. July 19, 2 | 2016-07-19 |
Dynamic Memory Structure
App 20150294974 - Lu; Nicky ; et al. | 2015-10-15 |
Dynamic memory structure
Grant 9,105,506 - Lu , et al. August 11, 2 | 2015-08-11 |
Electroplating Aid Board And Electroplating Device Using Same
App 20140197027 - KUO; MING-HONG | 2014-07-17 |
Transistor circuit layout structure
Grant 8,724,362 - Kuo May 13, 2 | 2014-05-13 |
Dynamic memory structure
Grant 8,659,068 - Kuo February 25, 2 | 2014-02-25 |
Transmission Mechanism Of Vertical Circuit Board Etching Device
App 20140021017 - KUO; MING-HONG | 2014-01-23 |
Dynamic Memory Structure
App 20130087839 - Kuo; Ming-Hong | 2013-04-11 |
Transistor Circuit Layout Structure
App 20130088907 - Kuo; Ming-Hong | 2013-04-11 |
Dynamic Memory Structure
App 20120326219 - Lu; Nicky ; et al. | 2012-12-27 |
Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory device
Grant 8,331,178 - Liu , et al. December 11, 2 | 2012-12-11 |
Connector Applied To A Portable Device And Method Of Connecting A Portable Device With An External Device
App 20120254470 - Kuo; Ming-Hong ; et al. | 2012-10-04 |
Memory Device Capable Of Operation In A Burn In Stress Mode, Method For Performing Burn In Stress On A Memory Device, And Method For Detecting Leakage Current Of A Memory Device
App 20120163107 - Liu; Shi-Huei ; et al. | 2012-06-28 |
Re-routing method and the circuit thereof
App 20080202800 - Kuo; Ming-Hong ; et al. | 2008-08-28 |
Re-routing method and the circuit thereof
App 20060284635 - Kuo; Ming-Hong ; et al. | 2006-12-21 |
Transporting device for a vertical-type thin circuit board etching machine
App 20050006205 - Kuo, Ming Hong | 2005-01-13 |
Method of fabricating a capacitor under bit line DRAM structure using contact hole liners
Grant 6,184,081 - Jeng , et al. February 6, 2 | 2001-02-06 |
Shallow trench isolator via non-critical chemical mechanical polishing
Grant 6,171,929 - Yang , et al. January 9, 2 | 2001-01-09 |
Method of making a shallow trench isolation for ULSI formation via in-direct CMP process
Grant 6,057,210 - Yang , et al. May 2, 2 | 2000-05-02 |
Method for fabricating a damascene landing pad
Grant 6,017,813 - Kuo January 25, 2 | 2000-01-25 |
Design and a novel process for formation of DRAM bit line and capacitor node contacts
Grant 6,008,085 - Sung , et al. December 28, 1 | 1999-12-28 |
Locos method with double polysilicon/silicon nitride spacer
Grant 5,658,822 - Wu , et al. August 19, 1 | 1997-08-19 |
Method of forming nitride sidewalls having spacer feet in a locos process
Grant 5,643,824 - Chien , et al. July 1, 1 | 1997-07-01 |
| 