Kuniyoshi; Shinji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kuniyoshi; Shinji.The latest application filed is for "probe and electrical connecting apparatus using it".
- Kuniyoshi; Shinji - Tokyo JP
- Kuniyoshi; Shinji - Aomori JP
- Kuniyoshi; Shinji - Suginami JP
- Kuniyoshi; Shinji - Kokubunji JA
| Patent | Date |
|---|---|
| Probe and electrical connecting apparatus using it Grant 7,924,038 - Kuniyoshi , et al. April 12, 2 | 2011-04-12 |
| Probe And Electrical Connecting Apparatus Using It App 20100219854 - Kuniyoshi; Shinji ; et al. | 2010-09-02 |
| Method for manufacturing an electrical test probe Grant 7,736,690 - Hirakawa , et al. June 15, 2 | 2010-06-15 |
| Probe for electrical test and electrical connecting apparatus using it Grant 7,679,389 - Kuniyoshi , et al. March 16, 2 | 2010-03-16 |
| Probe assembly, method of producing it and electrical connecting apparatus Grant 7,667,472 - Miura , et al. February 23, 2 | 2010-02-23 |
| Electrical test probe Grant 7,629,807 - Hirakawa , et al. December 8, 2 | 2009-12-08 |
| Electrical test probe and electrical test probe assembly Grant 7,586,321 - Hirakawa , et al. September 8, 2 | 2009-09-08 |
| Probe board mounting apparatus Grant 7,586,316 - Kuniyoshi , et al. September 8, 2 | 2009-09-08 |
| Probe for electrical test and probe assembly Grant 7,557,593 - Hirakawa , et al. July 7, 2 | 2009-07-07 |
| Method of manufacturing a probe Grant 7,523,539 - Hayashizaki , et al. April 28, 2 | 2009-04-28 |
| Electrical Test Probe App 20090058441 - Hirakawa; Hideki ; et al. | 2009-03-05 |
| Probe Assembly, Method Of Producing It And Electrical Connecting Apparatus App 20090058440 - Miura; Kiyotoshi ; et al. | 2009-03-05 |
| Probe For Electrical Test And Electrical Connecting Apparatus Using It App 20090051382 - Kuniyoshi; Shinji ; et al. | 2009-02-26 |
| Electrical Connecting Apparatus App 20080315905 - Kuniyoshi; Shinji ; et al. | 2008-12-25 |
| Electrical Test Probe And Method For Manufacturing The Same App 20080186038 - HIRAKAWA; Hideki ; et al. | 2008-08-07 |
| Probe And Method For Manufacturing The Same App 20080143368 - HAYASHIZAKI; Takayuki ; et al. | 2008-06-19 |
| Fabrication method for semiconductor integrated circuit device Grant 7,375,037 - Yamazaki , et al. May 20, 2 | 2008-05-20 |
| Electrical Test Probe And Electrical Test Probe Assembly App 20080074128 - HIRAKAWA; Hideki ; et al. | 2008-03-27 |
| Probe For Electrical Test And Probe Assembly App 20070210813 - Hirakawa; Hideki ; et al. | 2007-09-13 |
| Probe use in electric test App 20070018633 - Hirakawa; Hideki ; et al. | 2007-01-25 |
| Fabrication method for semiconductor integrated circuit device App 20040033692 - Yamazaki, Kazuo ; et al. | 2004-02-19 |
| Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit device Grant 6,633,072 - Yamazaki , et al. October 14, 2 | 2003-10-14 |
| Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit device App 20020014662 - Yamazaki, Kazuo ; et al. | 2002-02-07 |
| Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit device App 20010028093 - Yamazaki, Kazuo ; et al. | 2001-10-11 |
| Semiconductor integrated circuit device fabrication method and its fabrication apparatus Grant 5,497,331 - Iriki , et al. March 5, 1 | 1996-03-05 |
| Mask for exposing wafer with radiation and its exposing method Grant 5,115,456 - Kimura , et al. May 19, 1 | 1992-05-19 |
| Method and apparatus for correcting defects of X-ray mask Grant 4,933,565 - Yamaguchi , et al. June 12, 1 | 1990-06-12 |
| Method of correcting defect in circuit pattern Grant 4,925,755 - Yamaguchi , et al. May 15, 1 | 1990-05-15 |
| Crystal monochromator Grant 4,737,973 - Ogawa , et al. April 12, 1 | 1988-04-12 |
| Optical exposer Grant 4,690,529 - Sugiyama , et al. September 1, 1 | 1987-09-01 |
| Pattern detector Grant 4,614,432 - Kuniyoshi , et al. September 30, 1 | 1986-09-30 |
| Pattern detector Grant 4,597,669 - Terasawa , et al. July 1, 1 | 1986-07-01 |
| Pattern forming apparatus Grant 4,480,910 - Takanashi , et al. November 6, 1 | 1984-11-06 |
| Automatic focusing apparatus Grant 4,477,183 - Kawamura , et al. October 16, 1 | 1984-10-16 |
| Pattern detecting apparatus Grant 4,441,206 - Kuniyoshi , et al. April 3, 1 | 1984-04-03 |
| Optical exposure apparatus Grant 4,057,347 - Moriyama , et al. November 8, 1 | 1977-11-08 |
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