loadpatents
Patent applications and USPTO patent grants for Kumazawa; Takaaki.The latest application filed is for "tonearm unit and playback device".
Patent | Date |
---|---|
Tonearm unit and playback device Grant 10,789,974 - Yamashiro , et al. September 29, 2 | 2020-09-29 |
Tonearm Unit And Playback Device App 20200058321 - YAMASHIRO; Tomoyuki ;   et al. | 2020-02-20 |
Method and program for selecting product to be inspected Grant 7,899,567 - Tanaka , et al. March 1, 2 | 2011-03-01 |
Method for calculating environmental load, program for calculating environmental load, and method for converting units Grant 7,840,361 - Kumazawa , et al. November 23, 2 | 2010-11-23 |
Method And Program For Selecting Product To Be Inspected App 20080269936 - TANAKA; Masataka ;   et al. | 2008-10-30 |
Method For Calculating Environmental Load, Program For Calculating Environmental Load, And Method For Converting Units App 20080208473 - Kumazawa; Takaaki ;   et al. | 2008-08-28 |
Method for extracting injustice of component attribute information and system for extracting injustice of object attribute information App 20070061310 - Ninagawa; Noriyasu ;   et al. | 2007-03-15 |
Parts table management system, parts table preparation method and program App 20060053070 - Kumazawa; Takaaki | 2006-03-09 |
Method for test conditions Grant 6,895,346 - Hamamura , et al. May 17, 2 | 2005-05-17 |
System and apparatus for managing information on chemical substances used in product App 20050071259 - Arai, Shinichi ;   et al. | 2005-03-31 |
Photomask for test wafers Grant 6,841,405 - Hamamura , et al. January 11, 2 | 2005-01-11 |
System for testing electronic devices Grant 6,780,660 - Hamamura , et al. August 24, 2 | 2004-08-24 |
Method of testing electronic devices indicating short-circuit Grant 6,771,077 - Hamamura , et al. August 3, 2 | 2004-08-03 |
Method of testing electronic devices Grant 6,770,496 - Hamamura , et al. August 3, 2 | 2004-08-03 |
Audio-video device reproducing apparatus Grant 6,704,495 - Kumazawa , et al. March 9, 2 | 2004-03-09 |
Photomask for test wafers App 20030197522 - Hamamura, Yuichi ;   et al. | 2003-10-23 |
Method of testing electronic devices App 20030197523 - Hamamura, Yuichi ;   et al. | 2003-10-23 |
System for testing electronic devices App 20030199111 - Hamamura, Yuichi ;   et al. | 2003-10-23 |
Method of manufacturing electronic devices App 20030199107 - Hamamura, Yuichi ;   et al. | 2003-10-23 |
Method for test conditions App 20030199110 - Hamamura, Yuichi ;   et al. | 2003-10-23 |
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