loadpatents
Patent applications and USPTO patent grants for Kukreja; Himanshu.The latest application filed is for "inter-domain power element testing using scan".
Patent | Date |
---|---|
Inter-domain power element testing using scan Grant 11,047,909 - Kukreja , et al. June 29, 2 | 2021-06-29 |
Inter-Domain Power Element Testing Using Scan App 20200132762 - Kukreja; Himanshu ;   et al. | 2020-04-30 |
On-chip test pattern generation Grant 10,120,026 - Kukreja , et al. November 6, 2 | 2018-11-06 |
Metal layer independent version identifier Grant 10,032,723 - Tammanur Ranganathan , et al. July 24, 2 | 2018-07-24 |
Metal Layer Independent Version Identifier App 20180151506 - Tammanur Ranganathan; Karthik ;   et al. | 2018-05-31 |
On-Chip Test Pattern Generation App 20170102431 - Kukreja; Himanshu ;   et al. | 2017-04-13 |
Circuit to reduce peak power during transition fault testing of integrated circuit Grant 8,832,510 - Kukreja , et al. September 9, 2 | 2014-09-09 |
Low leakage current operation of integrated circuit using scan chain Grant 8,689,068 - Jain , et al. April 1, 2 | 2014-04-01 |
Method for partitioning scan chain Grant 8,504,886 - Kukreja , et al. August 6, 2 | 2013-08-06 |
Low Leakage Current Operation Of Integrated Circuit Using Scan Chain App 20130139013 - JAIN; Siddhartha ;   et al. | 2013-05-30 |
Scan Testing Of Integrated Circuit With Clock Gating Cells App 20130117618 - KUKREJA; HIMANSHU ;   et al. | 2013-05-09 |
Circuit To Reduce Peak Power During Transition Fault Testing Of Integrated Circuit App 20130091395 - KUKREJA; HIMANSHU ;   et al. | 2013-04-11 |
Method For Partitioning Scan Chain App 20130031433 - KUKREJA; Himanshu ;   et al. | 2013-01-31 |
System For Boundary Scan Register Chain Compression App 20110179325 - Gupta; Anuj ;   et al. | 2011-07-21 |
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