KUIPER; Stefan

Patent Applications and Registrations

Patent applications and USPTO patent grants for KUIPER; Stefan.The latest application filed is for "controllably deformable mirror device".

Company Profile

5.5.7

KUIPER; Stefan - 's-Gravenhage NL
Kuiper; Stefan - The Hague NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Controllably Deformable Mirror Device App 20220252864 - KUIPER; Stefan ; et al.	2022-08-11
Device and method for positioning a moveable member, and a steerable mirror unit including such device Grant 11,385,456 - Kuiper July 12, 2	2022-07-12
Directable Light Beam Handling Device For Optical Communication App 20210116700 - KUIPER; Stefan	2021-04-22
Optical coherence tomography method, system and computer program product therefor Grant 10,743,759 - Kuiper , et al. A	2020-08-18
Method of determining an overlay error, manufacturing method and system for manufacturing of a multilayer semiconductor device, and semiconductor device manufactured thereby Grant 10,712,674 - Kuiper , et al.	2020-07-14
A Device And Method For Positioning A Moveable Member, And A Steerable Mirror Unit Including Such Device App 20200218059 - Kuiper; Stefan	2020-07-09
Scanning probe microscopy system for mapping nanostructures on a surface of a sample and metrology frame therefore Grant 10,451,650 - Kuiper , et al. Oc	2019-10-22
Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sample Grant 10,288,643 - Kuiper , et al.	2019-05-14
Method Of Determining An Overlay Error, Manufacturing Method And System For Manufacturing Of A Multilayer Semiconductor Device, And Semiconductor Device Manufactured Thereby App 20180329312 - Kuiper; Stefan ; et al.	2018-11-15
Scanning Probe Microscopy System For Mapping High Aspect Ratio Nanostructures On A Surface Of A Sample App 20180210008 - Kuiper; Stefan ; et al.	2018-07-26
Scanning Probe Microscopy System For Mapping Nanostructures On A Surface Of A Sample And Metrology Frame Therefore App 20180203038 - Kuiper; Stefan ; et al.	2018-07-19
Optical Coherence Tomography Method, System And Computer Program Product Therefor App 20180092527 - Kuiper; Stefan ; et al.	2018-04-05

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