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Patent applications and USPTO patent grants for Kuehn; Olaf.The latest application filed is for "transistor device and method for forming a recess for a trench gate electrode".
Patent | Date |
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Transistor Device and Method for Forming a Recess for a Trench Gate Electrode App 20200111896 - Feil; Thomas ;   et al. | 2020-04-09 |
XMR sensors with high shape anisotropy Grant 9,915,707 - Zimmer , et al. March 13, 2 | 2018-03-13 |
Xmr Sensors With High Shape Anisotropy App 20170160350 - Zimmer; Juergen ;   et al. | 2017-06-08 |
XMR sensors with high shape anisotropy Grant 9,606,197 - Zimmer , et al. March 28, 2 | 2017-03-28 |
Xmr Sensors With High Shape Anisotropy App 20150355295 - Zimmer; Juergen ;   et al. | 2015-12-10 |
XMR sensors with high shape anisotropy Grant 9,146,287 - Zimmer , et al. September 29, 2 | 2015-09-29 |
Xmr Sensors With High Shape Anisotropy App 20120119735 - Zimmer; Juergen ;   et al. | 2012-05-17 |
Surveying apparatus and method of analyzing measuring data Grant 7,496,471 - Usbeck , et al. February 24, 2 | 2009-02-24 |
Surveying apparatus and method of analyzing measuring data App 20070258647 - Usbeck; Christian ;   et al. | 2007-11-08 |
Surveying apparatus and method of analyzing measuring data Grant 7,246,034 - Usbeck , et al. July 17, 2 | 2007-07-17 |
Surveying apparatus and method of analyzing measuring data App 20050228614 - Usbeck, Christian ;   et al. | 2005-10-13 |
Method of determining the endpoint of a planarization process Grant 6,932,674 - Lahnor , et al. August 23, 2 | 2005-08-23 |
Method of planarizing substrates Grant 6,827,635 - Lahnor , et al. December 7, 2 | 2004-12-07 |
Method Of Planarizing Substrates App 20040185756 - Lahnor, Peter ;   et al. | 2004-09-23 |
Method Of Determining The Endpoint Of A Planarization Process App 20040176015 - Lahnor, Peter ;   et al. | 2004-09-09 |
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