Kubo; Toshiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kubo; Toshiro.The latest application filed is for "inspection device and method".
- Kubo; Toshiro - Hitachinaka JP
- Kubo; Toshiro - Katsuta JP
| Patent | Date |
|---|---|
| Inspection Device And Method App 20120144938 - Inagaki; Katsuyasu ; et al. | 2012-06-14 |
| Method and apparatus for collecting defect images Grant 7,105,815 - Obara , et al. September 12, 2 | 2006-09-12 |
| Scanning electron microscope Grant 6,979,821 - Suzuki , et al. December 27, 2 | 2005-12-27 |
| Method and apparatus for collecting defect images App 20050199808 - Obara, Kenji ; et al. | 2005-09-15 |
| Method of observing defects App 20050087686 - Honda, Toshifumi ; et al. | 2005-04-28 |
| Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same Grant 6,765,205 - Ochiai , et al. July 20, 2 | 2004-07-20 |
| Scanning electron microscope App 20040113074 - Suzuki, Naomasa ; et al. | 2004-06-17 |
| Electron Microscope Including Apparatus For X-ray Analysis And Method Of Analyzing Specimens Using Same App 20040099805 - Ochiai, Isao ; et al. | 2004-05-27 |
| Scanning electron microscope App 20030122074 - Suzuki, Naomasa ; et al. | 2003-07-03 |
| Scanning electron microscope Grant 6,555,819 - Suzuki , et al. April 29, 2 | 2003-04-29 |
| Electron lens Grant 5,442,182 - Kubo , et al. August 15, 1 | 1995-08-15 |
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