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name:-0.0064148902893066
name:-0.0064527988433838
name:-0.0043878555297852
Kuan; Shu Patent Filings

Kuan; Shu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kuan; Shu.The latest application filed is for "method of forming fully strained channels".

Company Profile
4.8.8
  • Kuan; Shu - Keelung TW
  • Kuan; Shu - Hsinchu TW
  • KUAN; Shu - Keelung City TW
  • Kuan; Shu - Hsin-Chu TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
P-type strained channel in a fin field effect transistor (FinFET) device
Grant 11,404,574 - More , et al. August 2, 2
2022-08-02
Method of manufacturing a semiconductor device and a semiconductor device
Grant 11,393,898 - Kuan , et al. July 19, 2
2022-07-19
Method of Forming Fully Strained Channels
App 20220223690 - More; Shahaji B. ;   et al.
2022-07-14
Method of manufacturing a semiconductor device and a semiconductor device
Grant 11,367,784 - More , et al. June 21, 2
2022-06-21
Method Of Manufacturing A Semiconductor Device And A Semiconductor Device
App 20210391450 - MORE; Shahaji B. ;   et al.
2021-12-16
Method Of Manufacturing A Semiconductor Device And A Semiconductor Device
App 20210273047 - KUAN; Shu ;   et al.
2021-09-02
P-Type Strained Channel in a Fin Field Effect Transistor (FinFET) Device
App 20210175359 - More; Shahaji B. ;   et al.
2021-06-10
P-type strained channel in a fin field effect transistor (FinFET) device
Grant 10,930,781 - More , et al. February 23, 2
2021-02-23
P-Type Strained Channel in a Fin Field Effect Transistor (FinFET) Device
App 20200111911 - More; Shahaji B. ;   et al.
2020-04-09
P-type strained channel in a fin field effect transistor (FinFET) device
Grant 10,510,889 - More , et al. Dec
2019-12-17
P-Type Strained Channel
App 20190165175 - MORE; Shahaji B. ;   et al.
2019-05-30
Method for detecting presence and location of defects in a substrate
Grant 9,917,189 - Hung , et al. March 13, 2
2018-03-13
Method for Detecting Presence and Location of Defects in a Substrate
App 20170033218 - Hung; Shih-Wei ;   et al.
2017-02-02
Apparatus with temperature self-compensation and method thereof
Grant 8,419,271 - Huang , et al. April 16, 2
2013-04-16
Apparatus With Temperature Self-Compensation And Method Thereof
App 20110158288 - Huang; Long-Sun ;   et al.
2011-06-30

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