Kuan; Chiyan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kuan; Chiyan.The latest application filed is for "method and system for inspecting an euv mask".

Company Profile

6.23.18

Kuan; Chiyan - San Jose CA
Kuan; Chiyan - Danville CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam inspection of ungrounded samples Grant 11,448,607 - Kuan September 20, 2	2022-09-20
Micro LED display panel Grant 11,366,153 - Kuo , et al. June 21, 2	2022-06-21
Method And System For Inspecting An Euv Mask App 20210172891 - Weng; Guochong ; et al.	2021-06-10
Method and system for inspecting an EUV mask Grant 10,775,325 - Weng , et al. Sept	2020-09-15
Dynamic Determination Of A Sample Inspection Recipe Of Charged Particle Beam Inspection App 20200286710 - CHEN; Zhong-wei ; et al.	2020-09-10
Micro LED Display Panel App 20200225277 - Kuo; Tzu-Yi ; et al.	2020-07-16
Charged Particle Beam Inspection Of Ungrounded Samples App 20200088657 - KUAN; Chiyan	2020-03-19
Method And System For Inspecting An Euv Mask App 20190170671 - WENG; Guochong ; et al.	2019-06-06
Method and system for inspecting an EUV mask Grant 10,088,438 - Weng , et al. October 2, 2	2018-10-02
Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Grant 10,054,556 - Wang , et al. August 21, 2	2018-08-21
Method and system for inspecting and grounding an EUV mask Grant 9,859,089 - Weng , et al. January 2, 2	2018-01-02
Method And System For Inspecting An Euv Mask App 20170052129 - Weng; Guochong ; et al.	2017-02-23
Structure Electron Beam Inspection System For Inspecting Extreme Ultraviolet Mask And Structure For Discharging Extreme Ultraviolet Mask App 20170053774 - WANG; You-Jin ; et al.	2017-02-23
Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Grant 9,572,237 - Wang , et al. February 14, 2	2017-02-14
Method and system for enhancing image quality Grant 9,436,985 - Kuan , et al. September 6, 2	2016-09-06
Method and System for Inspecting an EUV Mask App 20150325402 - Weng; Guochong ; et al.	2015-11-12
Charged particle beam apparatus Grant 9,177,758 - Chen , et al. November 3, 2	2015-11-03
Structure Electron Beam Inspection System For Inspecting Extreme Ultraviolet Mask And Structure For Discharging Extreme Ultraviolet Mask App 20150305131 - WANG; You-Jin ; et al.	2015-10-22
Reticle operation system Grant 9,164,399 - Wang , et al. October 20, 2	2015-10-20
Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Grant 9,113,538 - Wang , et al. August 18, 2	2015-08-18
Charged Particle Beam Apparatus App 20150144788 - Chen; Zhongwei ; et al.	2015-05-28
Method And System For Inspecting An Euv Mask App 20150102220 - Weng; Guoching ; et al.	2015-04-16
Method and system for enhancing image quality Grant 9,002,097 - Kuan , et al. April 7, 2	2015-04-07
Method for inspecting EUV reticle and apparatus thereof Grant 8,692,193 - Kuan , et al. April 8, 2	2014-04-08
Structure For Discharging Extreme Ultraviolet Mask App 20140027634 - WANG; You-Jin ; et al.	2014-01-30
Structure for discharging extreme ultraviolet mask Grant 8,575,573 - Wang , et al. November 5, 2	2013-11-05
Charged particle system for reticle/wafer defects inspection and review Grant 8,519,333 - Kuan , et al. August 27, 2	2013-08-27
Reticle Operation System App 20130176549 - Wang; Youjin ; et al.	2013-07-11
Structure For Discharging Extreme Ultraviolet Mask App 20120292509 - WANG; You-Jin ; et al.	2012-11-22
Charged Particle System For Reticle / Wafer Defects Inspection And Review App 20120280125 - KUAN; CHIYAN ; et al.	2012-11-08
Substrate and die defect inspection method Grant 8,295,580 - Kuan October 23, 2	2012-10-23
Method For Inspecting Euv Reticle And Apparatus Thereof App 20120228494 - KUAN; CHIYAN ; et al.	2012-09-13
Method for inspecting EUV reticle and apparatus thereof Grant 8,217,349 - Kuan , et al. July 10, 2	2012-07-10
Method For Inspecting Euv Reticle And Apparatus Thereof App 20120032076 - KUAN; CHIYAN ; et al.	2012-02-09
Substrate Inspection Method App 20110052040 - KUAN; CHIYAN	2011-03-03
Site stepping for electron beam micro analysis Grant 7,115,866 - Kroeze , et al. October 3, 2	2006-10-03

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