Patent | Date |
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Controlling of etch depth in deep via etching processes and resultant structures Grant 10,192,748 - Krywanczyk , et al. Ja | 2019-01-29 |
Controlling Of Etch Depth In Deep Via Etching Processes And Resultant Structures App 20180108535 - Krywanczyk; Timothy C. ;   et al. | 2018-04-19 |
Silicon chicklet pedestal Grant 8,806,740 - Chey , et al. August 19, 2 | 2014-08-19 |
Silicon chicklet pedestal Grant 8,595,919 - Chey , et al. December 3, 2 | 2013-12-03 |
Ultraviolet energy curable tape and method of making a semiconductor chip using the tape Grant 8,163,602 - Krywanczyk , et al. April 24, 2 | 2012-04-24 |
Method to recover patterned semiconductor wafers for rework Grant 8,034,718 - Codding , et al. October 11, 2 | 2011-10-11 |
Silicon Chicklet Pedestal App 20110199108 - Chey; S. Jay ;   et al. | 2011-08-18 |
Silicon Chicklet Pedestal App 20110199109 - Chey; S. Jay ;   et al. | 2011-08-18 |
Method of forming silicon chicklet pedestal Grant 7,987,591 - Chey , et al. August 2, 2 | 2011-08-02 |
Ultraviolet Energy Curable Tape And Method Of Making A Semiconductor Chip Using The Tape App 20110115072 - Krywanczyk; Timothy C. ;   et al. | 2011-05-19 |
Method of thinning a semiconductor substrate Grant 7,932,614 - Codding , et al. April 26, 2 | 2011-04-26 |
Ultraviolet energy curable tape and method of making a semiconductor chip using the tape Grant 7,902,682 - Krywanczyk , et al. March 8, 2 | 2011-03-08 |
Silicon Chicklet Pedestal App 20110037489 - Chey; S. Jay ;   et al. | 2011-02-17 |
Method Of Thinning A Semiconductor Substrate App 20110031620 - Codding; Steven R. ;   et al. | 2011-02-10 |
Method of thinning a semiconductor substrate Grant 7,867,876 - Codding , et al. January 11, 2 | 2011-01-11 |
Corrosion inhibitor additives to prevent semiconductor device bond-pad corrosion during wafer dicing operations Grant 7,855,130 - Cadieux , et al. December 21, 2 | 2010-12-21 |
Inspection method for protecting image sensor devices with front surface protection Grant 7,844,099 - Krywanczyk , et al. November 30, 2 | 2010-11-30 |
Methods to prevent ECC (edge chipping and cracking) damage during die picking process Grant 7,771,560 - Johnson , et al. August 10, 2 | 2010-08-10 |
Method Of Thinning A Semiconductor Substrate App 20100155936 - Codding; Steven R. ;   et al. | 2010-06-24 |
System and device for thinning wafers that have contact bumps Grant 7,722,446 - Krywanczyk , et al. May 25, 2 | 2010-05-25 |
Tape removal in semiconductor structure fabrication Grant 7,572,739 - Codding , et al. August 11, 2 | 2009-08-11 |
Methods To Prevent Ecc (edge Chipping And Cracking) Damage During Die Picking Process App 20090084499 - Johnson; James R. ;   et al. | 2009-04-02 |
Silicon wafer thinning end point method Grant 7,498,236 - Codding , et al. March 3, 2 | 2009-03-03 |
Application of a thermally conductive thin film to a wafer backside prior to dicing to prevent chipping and cracking Grant 7,387,911 - Audette , et al. June 17, 2 | 2008-06-17 |
Method To Recover Patterned Semiconductor Wafers For Rework App 20080138989 - Codding; Steven R. ;   et al. | 2008-06-12 |
Silicon Wafer Thinning End Point Method App 20080124896 - Codding; Steven R. ;   et al. | 2008-05-29 |
Inspection Method For Protecting Image Sensor Devices With Front Surface Protection App 20080113458 - Krywanczyk; Timothy C. ;   et al. | 2008-05-15 |
Process For Protecting Image Sensor Wafers From Front Surface Damage And Contamination App 20080113456 - Codding; Steven R. ;   et al. | 2008-05-15 |
Rework Process For Removing Residual Uv Adhesive From C4 Wafer Surfaces App 20080099149 - Codding; Steven R. ;   et al. | 2008-05-01 |
Rework process for removing residual UV adhesive from C4 wafer surfaces Grant 7,348,216 - Codding , et al. March 25, 2 | 2008-03-25 |
Semiconductor Wafer Front Side Protection App 20080064185 - Abrams; Allan D. ;   et al. | 2008-03-13 |
Semiconductor wafer front side protection Grant 7,288,465 - Abrams , et al. October 30, 2 | 2007-10-30 |
Rework process for removing residual UV adhesive from C4 wafer surfaces App 20070077752 - Codding; Steven R. ;   et al. | 2007-04-05 |
Method For Cleaning Particulate Foreign Matter From The Surfaces Of Semiconductor Wafers App 20070054115 - Codding; Steven R. ;   et al. | 2007-03-08 |
System and Device For Thinning Wafers That Have Contact Bumps App 20070029045 - Krywanczyk; Timothy C. ;   et al. | 2007-02-08 |
Method for thinning wafers that have contact bumps Grant 7,135,124 - Krywanczyk , et al. November 14, 2 | 2006-11-14 |
Tape Removal In Semiconductor Structure Fabrication App 20060163204 - Codding; Steven R. ;   et al. | 2006-07-27 |
Use of photoresist in substrate vias during backside grind Grant 7,074,715 - Brouillette , et al. July 11, 2 | 2006-07-11 |
Application of a thermally conductive thin film to a wafer backside prior to dicing to prevent chipping and cracking App 20060105547 - Audette; David M. ;   et al. | 2006-05-18 |
Method of polishing C4 molybdenum masks to remove molybdenum peaks Grant 7,025,891 - Codding , et al. April 11, 2 | 2006-04-11 |
Semiconductor wafer front side protection Grant 7,001,827 - Abrams , et al. February 21, 2 | 2006-02-21 |
Semiconductor wafer front side protection App 20050202678 - Abrams, Allan D. ;   et al. | 2005-09-15 |
Ultraviolet energy curable tape and method of making a semiconductor chip using the tape App 20050104147 - Krywanczyk, Timothy C. ;   et al. | 2005-05-19 |
Method for thinning wafers that have contact bumps App 20050106879 - Krywanczyk, Timothy C. ;   et al. | 2005-05-19 |
Use of photoresist in substrate vias during backside grind Grant 6,888,223 - Brouillette , et al. May 3, 2 | 2005-05-03 |
Use of photoresist in substrate vias during backside grind App 20050090110 - Brouillette, Donald W. ;   et al. | 2005-04-28 |
Method Of Polishing C4 Molybdenum Masks To Remove Molybdenum Peaks App 20050045591 - Codding, Steven R. ;   et al. | 2005-03-03 |
Semiconductor wafer front side protection App 20040209444 - Abrams, Allan D. ;   et al. | 2004-10-21 |
Corrosion Inhibitor Additives To Prevent Semiconductor Device Bond-pad Corrosion During Wafer Dicing Operations App 20040209443 - Cadieux, Robert R. ;   et al. | 2004-10-21 |
Use of photoresist in substrate vias during backside grind App 20040198021 - Brouillette, Donald W. ;   et al. | 2004-10-07 |
Method to prevent leaving residual metal in CMP process of metal interconnect Grant 6,599,173 - Cruz , et al. July 29, 2 | 2003-07-29 |
Method for reworking copper metallurgy in semiconductor devices Grant 6,340,601 - Curran, Jr. , et al. January 22, 2 | 2002-01-22 |
Chemical mechanical polishing slurry and method for polishing metal/oxide layers App 20010052587 - Feeney, Paul M. ;   et al. | 2001-12-20 |