Krokhmal; Alexander
Patent Applications and Registrations
Patent applications and USPTO patent grants for Krokhmal; Alexander.The latest application filed is for "small-angle x-ray scatterometry".
- Krokhmal; Alexander - Haifa IL
| Patent | Date |
|---|---|
| X-ray tube Grant 11,302,508 - Krokhmal , et al. April 12, 2 | 2022-04-12 |
| Small-Angle X-Ray Scatterometry App 20220042933 - Dikopoltsev; Alex ; et al. | 2022-02-10 |
| Small-angle x-ray scatterometry Grant 11,181,490 - Dikopoltsev , et al. November 23, 2 | 2021-11-23 |
| Small-angle x-ray scatterometry App 20210285898 - Dikopoltsev; Alex ; et al. | 2021-09-16 |
| X-ray detection optics for small-angle X-ray scatterometry Grant 10,976,270 - Wormington , et al. April 13, 2 | 2021-04-13 |
| Wafer alignment for small-angle x-ray scatterometry Grant 10,976,269 - Vinshtein , et al. April 13, 2 | 2021-04-13 |
| X-ray source optics for small-angle X-ray scatterometry Grant 10,976,268 - Wormington , et al. April 13, 2 | 2021-04-13 |
| X-ray Tube App 20200168427 - Krokhmal; Alexander ; et al. | 2020-05-28 |
| X-ray detection optics for small-angle X-ray scatterometry App 20190323974 - Wormington; Matthew ; et al. | 2019-10-24 |
| Wafer alignment for small-angle X-ray scatterometry App 20190323976 - Vinshtein; Yuri ; et al. | 2019-10-24 |
| X-ray source optics for small-angle X-ray scatterometry App 20190323975 - Wormington; Matthew ; et al. | 2019-10-24 |
| Fast measurement of X-ray diffraction from tilted layers Grant 8,437,450 - Wall , et al. May 7, 2 | 2013-05-07 |
| Fast Measurement Of X-ray Diffraction From Tilted Layers App 20120140889 - Wall; John ; et al. | 2012-06-07 |
| X-ray measurement of properties of nano-particles Grant 7,680,243 - Yokhin , et al. March 16, 2 | 2010-03-16 |
| Target alignment for X-ray scattering measurements Grant 7,600,916 - Yokhin , et al. October 13, 2 | 2009-10-13 |
| Multifunction X-ray analysis system Grant 7,551,719 - Yokhin , et al. June 23, 2 | 2009-06-23 |
| X-ray measurement of properties of nano-particles App 20090067573 - Yokhin; Boris ; et al. | 2009-03-12 |
| Multi-detector EDXRD Grant 7,321,652 - Yokhin , et al. January 22, 2 | 2008-01-22 |
| Target alignment for x-ray scattering measurements App 20070286344 - Yokhin; Boris ; et al. | 2007-12-13 |
| Multi-detector Edxrd App 20070058779 - YOKHIN; Boris ; et al. | 2007-03-15 |
| Multifunction X-ray analysis system App 20060062351 - Yokhin; Boris ; et al. | 2006-03-23 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 