Krivy; Andrew J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Krivy; Andrew J..The latest application filed is for "probe card for semiconductor wafers and method and system for testing wafers".
- Krivy; Andrew J. - Boise ID
| Patent | Date |
|---|---|
| Probe card for semiconductor wafers having mounting plate and socket Grant 7,250,780 - Hembree , et al. July 31, 2 | 2007-07-31 |
| Method for testing semiconductor wafers Grant 6,798,224 - Hembree , et al. September 28, 2 | 2004-09-28 |
| Probe card for semiconductor wafers and method and system for testing wafers App 20040132222 - Hembree, David R. ; et al. | 2004-07-08 |
| Wafer for cleaning semiconductor device probe Grant 6,623,345 - Angell , et al. September 23, 2 | 2003-09-23 |
| Calibration target for calibrating semiconductor wafer test systems Grant 6,420,892 - Krivy , et al. July 16, 2 | 2002-07-16 |
| Probe card and test system for semiconductor wafers Grant 6,359,456 - Hembree , et al. March 19, 2 | 2002-03-19 |
| Wafer for cleaning semiconductor device probe App 20020019196 - Angell, Larry D. ; et al. | 2002-02-14 |
| Probe card and testing method for semiconductor wafers Grant 6,275,052 - Hembree , et al. August 14, 2 | 2001-08-14 |
| Wafer for cleaning semiconductor device probe Grant 6,254,469 - Angell , et al. July 3, 2 | 2001-07-03 |
| Calibration target for calibrating semiconductor wafer test systems Grant 6,239,590 - Krivy , et al. May 29, 2 | 2001-05-29 |
| Probe card for semiconductor wafers and method and system for testing wafers Grant 6,060,891 - Hembree , et al. May 9, 2 | 2000-05-09 |
| System for cleaning semiconductor device probe Grant 6,019,663 - Angell , et al. February 1, 2 | 2000-02-01 |
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