loadpatents
Patent applications and USPTO patent grants for KRISHNAN; Shankar.The latest application filed is for "event triggered measurement logging".
Patent | Date |
---|---|
Event Triggered Measurement Logging App 20220312230 - KUMAR; Rajeev ;   et al. | 2022-09-29 |
Scatterometry modeling in the presence of undesired diffraction orders Grant 11,422,095 - Atkins , et al. August 23, 2 | 2022-08-23 |
Model discovery and selection for cooperative machine learning in cellular networks Grant 11,424,962 - Kumar , et al. August 23, 2 | 2022-08-23 |
Handling Of Nr Qoe Measurements And Qoe Reporting In Rrc Modes App 20220217560 - KUMAR; Rajeev ;   et al. | 2022-07-07 |
Network-configured Training Procedure App 20220190990 - ZHU; Xipeng ;   et al. | 2022-06-16 |
Model Discovery And Selection For Cooperative Machine Learning In Cellular Networks App 20220182263 - KUMAR; Rajeev ;   et al. | 2022-06-09 |
Reflective Compact Lens For Magneto-optic Kerr Effect Metrology System App 20220137380 - ZHENG; Alex ;   et al. | 2022-05-05 |
Techniques for UE mobility prediction based radio resource management Grant 11,310,687 - Kumar , et al. April 19, 2 | 2022-04-19 |
Overlay metrology on bonded wafers Grant 11,309,202 - Krishnan , et al. April 19, 2 | 2022-04-19 |
Handover Optimization Based On Ue Mobility Prediction App 20220116838 - KUMAR; Rajeev ;   et al. | 2022-04-14 |
Application, Services, And Network Slice Based Measurements For Minimization Of Drive Test Reporting App 20220070709 - Kumar; Rajeev ;   et al. | 2022-03-03 |
Traffic Verification Measurements For Split Bearer Wireless Communication App 20220060925 - KUMAR; Rajeev ;   et al. | 2022-02-24 |
Quality Of Experience Measurement And Reporting App 20220053380 - Krishnan; Shankar ;   et al. | 2022-02-17 |
Early Measurements For Logged Minimization Of Drive Test App 20220046456 - Kumar; Rajeev ;   et al. | 2022-02-10 |
Enhancements To Mobility Settings Change Procedures App 20220046507 - Krishnan; Shankar ;   et al. | 2022-02-10 |
Quality Of Experience Techniques For A Wireless Communication System App 20220046503 - KUMAR; RAJEEV ;   et al. | 2022-02-10 |
Selective Measurement Reporting For A User Equipment App 20220046457 - Kumar; Rajeev ;   et al. | 2022-02-10 |
Quality Of Experience Measurements For Mobility Robustness App 20220038934 - Kumar; Rajeev ;   et al. | 2022-02-03 |
Techniques For Ue Mobility Prediction Based Radio Resource Management App 20220030453 - KUMAR; Rajeev ;   et al. | 2022-01-27 |
Multi-environment polarized infrared reflectometer for semiconductor metrology Grant 11,231,362 - Zhuang , et al. January 25, 2 | 2022-01-25 |
Inter-system And Event-triggered Mobility Load Balancing App 20220014968 - Krishnan; Shankar ;   et al. | 2022-01-13 |
Distributed Unit (du) Measurement And Event Reporting In Disaggregated Base Station App 20210337412 - ZHU; Xipeng ;   et al. | 2021-10-28 |
Solar Thermochemical Processing System and Method App 20210322946 - Wegeng; Robert S. ;   et al. | 2021-10-21 |
Mid-infrared spectroscopy for measurement of high aspect ratio structures Grant 11,137,350 - Wang , et al. October 5, 2 | 2021-10-05 |
Methods and systems for measurement of thick films and high aspect ratio structures Grant 11,119,050 - Sapiens , et al. September 14, 2 | 2021-09-14 |
Overlay Metrology On Bonded Wafers App 20210242060 - Krishnan; Shankar ;   et al. | 2021-08-05 |
Solar thermochemical processing system and method Grant 11,077,418 - Wegeng , et al. August 3, 2 | 2021-08-03 |
Sample transport device with integrated metrology Grant 11,056,366 - Bieli , et al. July 6, 2 | 2021-07-06 |
Magneto-optic Kerr effect metrology systems Grant 11,043,239 - Wang , et al. June 22, 2 | 2021-06-22 |
Magneto-optic Kerr Effect Metrology Systems App 20200302965 - Wang; Jun ;   et al. | 2020-09-24 |
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures App 20200284733 - Sapiens; Noam ;   et al. | 2020-09-10 |
Systems and Methods for Improved Optimization of Machine-Learned Models App 20200250515 - Kind Code | 2020-08-06 |
Mid-Infrared Spectroscopy For Measurement Of High Aspect Ratio Structures App 20200240907 - Wang; David Y. ;   et al. | 2020-07-30 |
Scatterometry Modeling in the Presence of Undesired Diffraction Orders App 20200232909 - Atkins; Phillip ;   et al. | 2020-07-23 |
Methods and systems for measurement of thick films and high aspect ratio structures Grant 10,690,602 - Sapiens , et al. | 2020-06-23 |
Temperature sensing based flow monitoring and fault detection Grant 10,612,980 - Jurski , et al. | 2020-04-07 |
Measurement of multiple patterning parameters Grant 10,612,916 - Shchegrov , et al. | 2020-04-07 |
Metrology system calibration refinement Grant 10,605,722 - Kwak , et al. | 2020-03-31 |
Optical measurement of a highly absorbing film layer over highly reflective film stacks Grant 10,551,166 - Ygartua , et al. Fe | 2020-02-04 |
Spectral reflectometry for in-situ process monitoring and control Grant 10,438,825 - Jain , et al. O | 2019-10-08 |
Sample Transport Device With Integrated Metrology App 20190295874 - Bieli; Giampietro ;   et al. | 2019-09-26 |
Guided image upsampling using bitmap tracing Grant 10,402,941 - Krishnan , et al. Sep | 2019-09-03 |
Critical dimension measurements with gaseous adsorption Grant 10,281,263 - Krishnan | 2019-05-07 |
Optical Measurement Of A Highly Absorbing Film Layer Over Highly Reflective Film Stacks App 20190107384 - Ygartua; Carlos L. ;   et al. | 2019-04-11 |
Infrared spectroscopic reflectometer for measurement of high aspect ratio structures Grant 10,215,693 - Krishnan , et al. Feb | 2019-02-26 |
Temperature Sensing Based Flow Monitoring And Fault Detection App 20180372551 - Jurski; Janusz P. ;   et al. | 2018-12-27 |
Method and apparatus for image filtering Grant 10,152,779 - Tian , et al. Dec | 2018-12-11 |
Measurement of semiconductor structures with capillary condensation Grant 10,145,674 - Krishnan De | 2018-12-04 |
Solar Thermochemical Processing System and Method App 20180339283 - Wegeng; Robert S. ;   et al. | 2018-11-29 |
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures App 20180238814 - Sapiens; Noam ;   et al. | 2018-08-23 |
Porosity measurement of semiconductor structures Grant 10,041,873 - Krishnan August 7, 2 | 2018-08-07 |
Optical metrology with reduced focus error sensitivity Grant 9,970,863 - Krishnan , et al. May 15, 2 | 2018-05-15 |
Small spot size spectroscopic ellipsometer Grant 9,952,140 - Wang , et al. April 24, 2 | 2018-04-24 |
Solar thermochemical processing system and method Grant 9,950,305 - Wegeng , et al. April 24, 2 | 2018-04-24 |
Metrology System Calibration Refinement App 20180100796 - Kwak; Hidong ;   et al. | 2018-04-12 |
Infrared Spectroscopic Reflectometer For Measurement Of High Aspect Ratio Structures App 20180088040 - Krishnan; Shankar ;   et al. | 2018-03-29 |
Systems and methods for extended infrared spectroscopic ellipsometry Grant 9,921,152 - Krishnan , et al. March 20, 2 | 2018-03-20 |
Simultaneous multi-angle spectroscopy Grant 9,921,104 - Krishnan , et al. March 20, 2 | 2018-03-20 |
Spectral Reflectometry For In-Situ Process Monitoring And Control App 20180061691 - Jain; Prateek ;   et al. | 2018-03-01 |
Measurement Of Multiple Patterning Parameters App 20180051984 - Shchegrov; Andrei V. ;   et al. | 2018-02-22 |
Metrology system calibration refinement Grant 9,857,291 - Kwak , et al. January 2, 2 | 2018-01-02 |
Simultaneous Multi-Angle Spectroscopy App 20170356800 - Krishnan; Shankar ;   et al. | 2017-12-14 |
Measurement of multiple patterning parameters Grant 9,816,810 - Shchegrov , et al. November 14, 2 | 2017-11-14 |
Guided Image Upsampling Using Bitmap Tracing App 20170316546 - Krishnan; Shankar ;   et al. | 2017-11-02 |
Critical Dimension Measurements With Gaseous Adsorption App 20170314913 - Krishnan; Shankar | 2017-11-02 |
Measurement Of Semiconductor Structures With Capillary Condensation App 20170314912 - Krishnan; Shankar | 2017-11-02 |
Porosity Measurement Of Semiconductor Structures App 20170315044 - Krishnan; Shankar | 2017-11-02 |
Guided image upsampling using bitmap tracing Grant 9,741,096 - Krishnan , et al. August 22, 2 | 2017-08-22 |
Heat exchanger methods, apparatuses and systems with a manifold structure Grant 9,721,871 - Frey , et al. August 1, 2 | 2017-08-01 |
Systems And Methods For Extended Infrared Spectroscopic Ellipsometry App 20170205342 - Krishnan; Shankar ;   et al. | 2017-07-20 |
Heat Exchanger Methods, Apparatuses And Systems With A Manifold Structure App 20170162475 - Frey; Emery E. ;   et al. | 2017-06-08 |
Ultrasound Assisted Immersion Cooling App 20170071079 - Krishnan; Shankar ;   et al. | 2017-03-09 |
Method And Apparatus For Image Filtering App 20170046822 - TIAN; CHAO ;   et al. | 2017-02-16 |
Guided Image Upsampling Using Bitmap Tracing App 20170039681 - Krishnan; Shankar ;   et al. | 2017-02-09 |
Measurement Of Multiple Patterning Parameters App 20170003123 - Shchegrov; Andrei V. ;   et al. | 2017-01-05 |
Method and apparatus for image filtering Grant 9,514,520 - Tian , et al. December 6, 2 | 2016-12-06 |
Ultrasound assisted immersion cooling Grant 9,516,792 - Krishnan , et al. December 6, 2 | 2016-12-06 |
Measurement of multiple patterning parameters Grant 9,490,182 - Shchegrov , et al. November 8, 2 | 2016-11-08 |
Guided image upsampling using bitmap tracing Grant 9,491,472 - Krishnan , et al. November 8, 2 | 2016-11-08 |
Optical metrology with reduced sensitivity to grating anomalies Grant 9,470,639 - Zhuang , et al. October 18, 2 | 2016-10-18 |
Ultrasound Assisted Immersion Cooling App 20160286694 - Krishnan; Shankar ;   et al. | 2016-09-29 |
System and method for providing separate communication zones in a large format videoconference Grant 9,456,178 - Yarosh , et al. September 27, 2 | 2016-09-27 |
Recirculating dielectric fluid cooling Grant 9,433,132 - Krishnan , et al. August 30, 2 | 2016-08-30 |
Optical Metrology With Reduced Focus Error Sensitivity App 20160245741 - Krishnan; Shankar ;   et al. | 2016-08-25 |
Selectably configurable multiple mode spectroscopic ellipsometry Grant 9,404,872 - Wang , et al. August 2, 2 | 2016-08-02 |
Method Of Manufacturing A Heat-transfer Structure App 20160193703 - Kempers; Roger Scott ;   et al. | 2016-07-07 |
Leak Detection In Liquid Cooled Computing Systems App 20160178475 - Krishnan; Shankar ;   et al. | 2016-06-23 |
Inspection System And Method Using An Off-axis Unobscured Objective Lens App 20160139032 - Rampoldi; Claudio ;   et al. | 2016-05-19 |
Heat-transfer structure Grant 9,308,571 - Kempers , et al. April 12, 2 | 2016-04-12 |
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,310,290 - Wang , et al. April 12, 2 | 2016-04-12 |
System And Method For Providing Separate Communication Zones In A Large Format Videoconference App 20160080691 - Yarosh; Svetlana ;   et al. | 2016-03-17 |
Recirculating Dielectric Fluid Cooling App 20160044833 - Krishnan; Shankar ;   et al. | 2016-02-11 |
System and method for providing separate communication zones in a large format videoconference Grant 9,232,183 - Yarosh , et al. January 5, 2 | 2016-01-05 |
Dynamically adjustable semiconductor metrology system Grant 9,228,943 - Wang , et al. January 5, 2 | 2016-01-05 |
Method And Apparatus For Image Filtering App 20150324960 - Tian; Chao ;   et al. | 2015-11-12 |
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20150285735 - Wang; David Y. ;   et al. | 2015-10-08 |
Light source tracking in optical metrology system Grant 9,146,156 - Zhuang , et al. September 29, 2 | 2015-09-29 |
Guided Image Upsampling Using Bitmap Tracing App 20150271499 - Krishnan; Shankar ;   et al. | 2015-09-24 |
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,116,103 - Wang , et al. August 25, 2 | 2015-08-25 |
Method and apparatus for image filtering Grant 9,111,336 - Tian , et al. August 18, 2 | 2015-08-18 |
Guided image upsampling using bitmap tracing Grant 9,076,236 - Krishnan , et al. July 7, 2 | 2015-07-07 |
Gasketted Thermal Interface App 20150184053 - KRISHNAN; SHANKAR ;   et al. | 2015-07-02 |
Interfacial Thermal Transfer Structure App 20150176915 - Krishnan; Shankar ;   et al. | 2015-06-25 |
Measurement Of Multiple Patterning Parameters App 20150176985 - Shchegrov; Andrei V. ;   et al. | 2015-06-25 |
Method And Apparatus For Image Filtering App 20150078675 - Tian; Chao ;   et al. | 2015-03-19 |
Apparatus and method for modification of telecommunication video content Grant 8,982,179 - North , et al. March 17, 2 | 2015-03-17 |
Guided Image Upsampling Using Bitmap Tracing App 20150071533 - KRISHNAN; Shankar ;   et al. | 2015-03-12 |
Heat-transfer structure Grant 8,963,323 - Kempers , et al. February 24, 2 | 2015-02-24 |
Method and apparatus for locating load-balanced facilities Grant 8,949,842 - Krishnan , et al. February 3, 2 | 2015-02-03 |
Heat-transfer Structure App 20150014841 - Kempers; Roger Scott ;   et al. | 2015-01-15 |
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20140375981 - Wang; David Y. ;   et al. | 2014-12-25 |
Metrology System Calibration Refinement App 20140340682 - Kwak; Hidong ;   et al. | 2014-11-20 |
System And Method For Providing Separate Communication Zones In A Large Format Videoconference App 20140313277 - Yarosh; Svetlana ;   et al. | 2014-10-23 |
Metrology systems and methods for high aspect ratio and large lateral dimension structures Grant 8,860,937 - Dziura , et al. October 14, 2 | 2014-10-14 |
Flow Diverters To Enhance Heat Sink Performance App 20140290925 - Hernon; Domhnaill ;   et al. | 2014-10-02 |
Flow Diverters To Enhance Heat Sink Performance App 20140262194 - Hernon; Domhnaill ;   et al. | 2014-09-18 |
Optical system polarizer calibration Grant 8,797,534 - de Veer , et al. August 5, 2 | 2014-08-05 |
System and method of bilateral image filtering Grant 8,737,735 - Tian , et al. May 27, 2 | 2014-05-27 |
Optical System Polarizer Calibration App 20140043608 - de Veer; Johannes D. ;   et al. | 2014-02-13 |
Apparatus And Method For Modification Of Telecommunication Video Content App 20130342629 - North; Stephen C. ;   et al. | 2013-12-26 |
System And Method Of Bilateral Image Filtering App 20130336585 - Tian; Chao ;   et al. | 2013-12-19 |
Small Spot Size Spectroscopic Ellipsometer App 20130321810 - Wang; Haiming ;   et al. | 2013-12-05 |
Monolithic Structurally Complex Heat Sink Designs App 20130299148 - Hernon; Domhnaill ;   et al. | 2013-11-14 |
Optical system polarizer calibration Grant 8,570,514 - de Veer , et al. October 29, 2 | 2013-10-29 |
System and method of image upsampling Grant 8,571,309 - Krishnan , et al. October 29, 2 | 2013-10-29 |
Global registration of multiple 3D point sets via optimization on a manifold Grant 8,538,138 - Krishnan , et al. September 17, 2 | 2013-09-17 |
Measurement of critical dimension Grant 8,456,639 - Krishnan , et al. June 4, 2 | 2013-06-04 |
Reconfigurable spectroscopic ellipsometer Grant 8,446,584 - Krishnan , et al. May 21, 2 | 2013-05-21 |
System and Method of Image Upsampling App 20130121568 - Krishnan; Shankar ;   et al. | 2013-05-16 |
Dynamically Adjustable Semiconductor Metrology System App 20130114085 - Wang; David Y. ;   et al. | 2013-05-09 |
Light Source Tracking In Optical Metrology System App 20130033704 - Zhuang; Guorong V. ;   et al. | 2013-02-07 |
Solar Thermochemical Processing System And Method App 20130025192 - Wegeng; Robert S. ;   et al. | 2013-01-31 |
Measurement of Critical Dimension App 20130003068 - Krishnan; Shankar ;   et al. | 2013-01-03 |
Optical System Polarizer Calibration App 20120320377 - de Veer; Johannes D. ;   et al. | 2012-12-20 |
Reconfigurable Spectroscopic Ellipsometer App 20120287433 - Krishnan; Shankar ;   et al. | 2012-11-15 |
Azimuth angle measurement Grant 8,040,511 - Krishnan , et al. October 18, 2 | 2011-10-18 |
Measurement of thin film porosity Grant 7,907,264 - Krishnan March 15, 2 | 2011-03-15 |
Global Registration of Multiple 3D Point Sets Via Optimization on a Manifold App 20110012898 - Krishnan; Shankar ;   et al. | 2011-01-20 |
Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system Grant 7,869,040 - Kwak , et al. January 11, 2 | 2011-01-11 |
Global registration of multiple 3D point sets via optimization on a manifold Grant 7,831,090 - Krishnan , et al. November 9, 2 | 2010-11-09 |
Spreading thermoelectric coolers Grant 7,825,324 - Hodes , et al. November 2, 2 | 2010-11-02 |
Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry Grant 7,755,764 - Kwak , et al. July 13, 2 | 2010-07-13 |
Method And Apparatus For Locating Load-balanced Facilities App 20100169891 - Krishnan; Shankar | 2010-07-01 |
Method And Apparatus For Locating Facilities App 20100088415 - ARCHER; AARON ;   et al. | 2010-04-08 |
Active Heat Sink Designs App 20090321044 - Hernon; Domhnaill ;   et al. | 2009-12-31 |
Monolithic Structurally Complex Heat Sink Designs App 20090321045 - Hernon; Domhnaill ;   et al. | 2009-12-31 |
Flow Diverters To Enhance Heat Sink Performance App 20090321046 - Hernon; Domhnaill ;   et al. | 2009-12-31 |
Heat-transfer Structure App 20090315173 - Kempers; Roger Scott ;   et al. | 2009-12-24 |
Thermally Conductive Periodically Structured Gap Fillers And Method For Utilizing Same App 20090213548 - Kempers; Roger S. ;   et al. | 2009-08-27 |
Cooling Hot-Spots by Lateral Active Heat Transport App 20090071525 - Hodes; Marc Scott ;   et al. | 2009-03-19 |
Ellipsometry measurement and analysis Grant 7,453,562 - Kaack , et al. November 18, 2 | 2008-11-18 |
Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system Grant 7,408,641 - Kwak , et al. August 5, 2 | 2008-08-05 |
Purge Gas Flow Control For High-precision Film Measurements Using Ellipsometry And Reflectometry App 20080180698 - Kwak; Hidong ;   et al. | 2008-07-31 |
Spreading Thermoelectric Coolers App 20080155992 - Hodes; Marc Scott ;   et al. | 2008-07-03 |
Systems and methods for measuring stress in a specimen Grant 7,274,440 - Janik , et al. September 25, 2 | 2007-09-25 |
Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings Grant 7,221,454 - Hampton , et al. May 22, 2 | 2007-05-22 |
Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals App 20060274310 - Kandel; Daniel ;   et al. | 2006-12-07 |
Process and apparatus for integrating sheet resistance measurements and reflectance measurements of a thin film in a common apparatus Grant 7,050,160 - Johnson , et al. May 23, 2 | 2006-05-23 |
Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI) Grant 7,006,222 - Krishnan February 28, 2 | 2006-02-28 |
Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings App 20050018189 - Hampton, D. Scott ;   et al. | 2005-01-27 |
Map simplification system Grant 6,812,925 - Krishnan , et al. November 2, 2 | 2004-11-02 |
Substrate thickness determination Grant 6,710,890 - Krishnan , et al. March 23, 2 | 2004-03-23 |
Hyperspectral polarization profiler for remote sensing Grant 6,052,187 - Krishnan , et al. April 18, 2 | 2000-04-18 |
Method and apparatus to simultaneously measure emissivities and thermodynamic temperatures of remote objects Grant 5,011,295 - Krishnan , et al. April 30, 1 | 1991-04-30 |
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