Krampe-Zadler; Christof
Patent Applications and Registrations
Patent applications and USPTO patent grants for Krampe-Zadler; Christof.The latest application filed is for "apparatus for the optical inspection of wafers".
- Krampe-Zadler; Christof - Castrop-Rauxel N/A DE
- Krampe-Zadler; Christof - Castrio-Rauxel DE
| Patent | Date |
|---|---|
| Apparatus for the optical inspection of wafers Grant 8,451,440 - Hahn , et al. May 28, 2 | 2013-05-28 |
| Illumination means and inspection means having an illumination means Grant 8,087,799 - Hahn , et al. January 3, 2 | 2012-01-03 |
| Apparatus for the Optical Inspection of Wafers App 20100295938 - Hahn; Kurt ; et al. | 2010-11-25 |
| Device And Method For The Inspection Of Defects On The Edge Region Of A Wafer App 20090279080 - Danner; Lambert ; et al. | 2009-11-12 |
| Illumination means and inspection means having an illumination means App 20090086483 - Hahn; Kurt ; et al. | 2009-04-02 |
| Device and method for scanning the whole surface of a wafer App 20090034832 - Vollrath; Wolfgang ; et al. | 2009-02-05 |
| Apparatus for wafer inspection App 20080144025 - Vollrath; Wolfgang ; et al. | 2008-06-19 |
| Apparatus for wafer inspection App 20080144014 - Vollrath; Wolfgang ; et al. | 2008-06-19 |
| Apparatus for Inspecting a Wafer App 20070013902 - Backhauss; Henning ; et al. | 2007-01-18 |
| Method of optically imaging and inspecting a wafer in the context of edge bead removal App 20060286811 - Heiden; Michael ; et al. | 2006-12-21 |
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