Kotelyanskii; Michael J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kotelyanskii; Michael J..The latest application filed is for "multiple measurement techniques including focused beam scatterometry for characterization of samples".

Company Profile

0.6.5

Kotelyanskii; Michael J. - Chatham NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Substrate analysis using surface acoustic wave metrology Grant 9,041,931 - Colgan , et al. May 26, 2	2015-05-26
Multiple Measurement Techniques Including Focused Beam Scatterometry For Characterization Of Samples App 20140375983 - Wolf; Robert Gregory ; et al.	2014-12-25
Multiple measurement techniques including focused beam scatterometry for characterization of samples Grant 8,699,027 - Wolf , et al. April 15, 2	2014-04-15
Substrate Analysis Using Surface Acoustic Wave Metrology App 20120309116 - Colgan; Michael ; et al.	2012-12-06
Multiple Measurement Techniques Including Focused Beam Scatterometry For Characterization Of Samples App 20120268744 - WOLF; Robert Gregory ; et al.	2012-10-25
Multiple measurement techniques including focused beam scatterometry for characterization of samples Grant 8,139,232 - Wolf , et al. March 20, 2	2012-03-20
Combination of ellipsometry and optical stress generation and detection Grant 7,903,238 - Mehendale , et al. March 8, 2	2011-03-08
Multiple Measurement Techniques Including Focused Beam Scatterometry For Characterization Of Samples App 20090279090 - Wolf; Robert Gregory ; et al.	2009-11-12
Combination of ellipsometry and optical stress generation and detection App 20090244516 - Mehendale; Manjusha ; et al.	2009-10-01

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