Kotelyanskii; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kotelyanskii; Michael.The latest application filed is for "characterization of patterned structures using acoustic metrology".

Company Profile

1.5.10

Kotelyanskii; Michael - Chatham NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Characterization Of Patterned Structures Using Acoustic Metrology App 20210318270 - Mehendale; Manjusha ; et al.	2021-10-14
Opto-acoustic metrology of signal attenuating structures Grant 10,209,300 - Kotelyanskii , et al. Feb	2019-02-19
Non-destructive acoustic metrology for void detection Grant 9,991,176 - Mehendale , et al. June 5, 2	2018-06-05
Non-destructive Acoustic Metrology For Void Detection App 20170221778 - MEHENDALE; Manjusha ; et al.	2017-08-03
Opto-acoustic Metrology Of Signal Attenuating Structures App 20170141004 - Kotelyanskii; Michael ; et al.	2017-05-18
Optical acoustic substrate assessment system and method Grant 9,576,862 - Murray , et al. February 21, 2	2017-02-21
Optical Acoustic Substrate Assessment System And Method App 20160043008 - MURRAY; Todd ; et al.	2016-02-11
Position Sensitive Detection Optimization App 20140103188 - Mehendale; Manjusha ; et al.	2014-04-17
Structure Model description and use for scatterometry-based semiconductor manufacturing process metrology App 20090306941 - Kotelyanskii; Michael ; et al.	2009-12-10
Combined ultra-fast x-ray and optical system for thin film measurements App 20060256916 - Kotelyanskii; Michael ; et al.	2006-11-16
Measuring Elastic Moduli Of Dielectric Thin Films Using An Optical Metrology System App 20060072120 - Leary; Sean P. ; et al.	2006-04-06
Measuring elastic moduli of dielectric thin films using an optical metrology system Grant 7,019,845 - Leary , et al. March 28, 2	2006-03-28

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