Koshihara; Shunsuke
Patent Applications and Registrations
Patent applications and USPTO patent grants for Koshihara; Shunsuke.The latest application filed is for "image processor, method for generating pattern using self-organizing lithographic techniques and computer program".
- Koshihara; Shunsuke - Tokyo JP
- Koshihara; Shunsuke - Hitachinaka N/A JP
- Koshihara; Shunsuke - Kitachinaka N/A JP
- Koshihara; Shunsuke - Hitachinaka-shi JP
| Patent | Date |
|---|---|
| Image processor, method for generating pattern using self-organizing lithographic techniques and computer program Grant 10,732,512 - Sutani , et al. | 2020-08-04 |
| Image Processor, Method for Generating Pattern Using Self-Organizing Lithographic Techniques and Computer Program App 20180181009 - SUTANI; Takumichi ; et al. | 2018-06-28 |
| Image Processor, Method For Generating Pattern Using Self- Organizing Lithographic Techniques And Computer Program App 20150277237 - Sutani; Takumichi ; et al. | 2015-10-01 |
| Method for measuring sample and measurement device Grant 8,581,187 - Kijima , et al. November 12, 2 | 2013-11-12 |
| Method for adjusting imaging magnification and charged particle beam apparatus Grant 8,552,371 - Sukegawa , et al. October 8, 2 | 2013-10-08 |
| Template creation method and image processor therefor Grant 8,180,140 - Yang , et al. May 15, 2 | 2012-05-15 |
| Method For Measuring Sample And Measurement Device App 20110139982 - Kijima; Mihoko ; et al. | 2011-06-16 |
| Method and System for Wafer Inspection App 20110096309 - Paul Wiaux; Vincent Jean-Marie Pierre ; et al. | 2011-04-28 |
| Method For Adjusting Imaging Magnification And Charged Particle Beam Apparatus App 20110042568 - SUKEGAWA; SHIGEKI ; et al. | 2011-02-24 |
| Method for adjusting imaging magnification and charged particle beam apparatus Grant 7,834,316 - Sukegawa , et al. November 16, 2 | 2010-11-16 |
| Template Creation Method And Image Processor Therefor App 20090304286 - Yang; Kyoungmo ; et al. | 2009-12-10 |
| Scanning electron microscope Grant 7,521,695 - Nakada , et al. April 21, 2 | 2009-04-21 |
| Method For Adjusting Imaging Magnification And Charged Particle Beam Apparatus App 20080217529 - SUKEGAWA; Shigeki ; et al. | 2008-09-11 |
| Scanning electron microscope App 20070194234 - Nakada; Yoshinori ; et al. | 2007-08-23 |
| Scanning electron microscope Grant 7,217,925 - Nakada , et al. May 15, 2 | 2007-05-15 |
| Scanning electron microscope App 20060102840 - Nakada; Yoshinori ; et al. | 2006-05-18 |
| Scanning electron microscope Grant 7,009,178 - Nakada , et al. March 7, 2 | 2006-03-07 |
| Scanning electron microscope App 20050178965 - Nakada, Yoshinori ; et al. | 2005-08-18 |
| Scanning electron microscope Grant 6,897,445 - Nakada , et al. May 24, 2 | 2005-05-24 |
| Scanning electron microscope App 20040094713 - Nakada, Yoshinori ; et al. | 2004-05-20 |
| Scanning electron microscope Grant 6,713,761 - Nakada , et al. March 30, 2 | 2004-03-30 |
| Scanning electron microscope App 20010054692 - Nakada, Yoshinori ; et al. | 2001-12-27 |
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