Korchev; Yuri Evgenievich

Patent Applications and Registrations

Patent applications and USPTO patent grants for Korchev; Yuri Evgenievich.The latest application filed is for "scanning ion conductance microscopy using surface roughness for probe movement".

Company Profile

0.5.4

Korchev; Yuri Evgenievich - London GB

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanning ion conductance microscopy using surface roughness for probe movement Grant 9,709,598 - Novak , et al. July 18, 2	2017-07-18
Scanning Ion Conductance Microscopy Using Surface Roughness For Probe Movement App 20160274146 - NOVAK; PAVEL ; et al.	2016-09-22
Scanning ion conductance microscopy using piezo actuators of different response times Grant 9,354,249 - Novak , et al. May 31, 2	2016-05-31
Scanning Ion Conductance Microscopy Using Surface Roughness For Probe Movement App 20130312143 - NOVAK; PAVEL ; et al.	2013-11-21
Scanning ion conductance microscopy for the investigation of living cells Grant 8,006,316 - Korchev , et al. August 23, 2	2011-08-23
Scanning Ion Conductance Microscopy For The Investigation Of Living Cells App 20090260114 - Korchev; Yuri Evgenievich ; et al.	2009-10-15
Patch-clamping and its use in analyzing subcellular features Grant 7,057,171 - Korchev , et al. June 6, 2	2006-06-06
Optical microscopy and its use in the study of cells Grant 6,929,934 - Korchev , et al. August 16, 2	2005-08-16
Patch-clamping and its use in analysing subcellular features App 20040140427 - Korchev, Yuri Evgenievich ; et al.	2004-07-22

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