Koprowski; Timothy J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Koprowski; Timothy J..The latest application filed is for "string dataflow error detection".

Company Profile

0.15.8

Koprowski; Timothy J. - Newburgh NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
String dataflow error detection Grant 9,715,420 - Cuffney , et al. July 25, 2	2017-07-25
String dataflow error detection Grant 9,588,838 - Cuffney , et al. March 7, 2	2017-03-07
String Dataflow Error Detection App 20160266959 - Cuffney; James R. ; et al.	2016-09-15
String Dataflow Error Detection App 20160211850 - Cuffney; James R. ; et al.	2016-07-21
String Dataflow Error Detection App 20160210182 - Cuffney; James R. ; et al.	2016-07-21
String dataflow error detection Grant 9,389,955 - Cuffney , et al. July 12, 2	2016-07-12
Design-based weighting for logic built-in self-test Grant 9,292,398 - Cook , et al. March 22, 2	2016-03-22
Design-Based weighting for logic built-in self-test Grant 9,292,399 - Cook , et al. March 22, 2	2016-03-22
Design-based Weighting For Logic Built-in Self-test App 20150168489 - Cook; Gregory J. ; et al.	2015-06-18
Design-based Weighting For Logic Built-in Self-test App 20150169423 - Cook; Gregory J. ; et al.	2015-06-18
Pseudo random optimized built-in self-test Grant 6,968,489 - Motika , et al. November 22, 2	2005-11-22
Pseudo random LBIST controls App 20040230882 - Huott, William V. ; et al.	2004-11-18
VLSI chip test power reduction Grant 6,816,990 - Song , et al. November 9, 2	2004-11-09
Deterministic random LBIST Grant 6,708,305 - Farnsworth , et al. March 16, 2	2004-03-16
Method and apparatus for programmable LBIST channel weighting Grant 6,671,838 - Koprowski , et al. December 30, 2	2003-12-30
Method and system for at speed diagnostics and bit fail mapping Grant 6,629,281 - McNamara , et al. September 30, 2	2003-09-30
Method and apparatus for delaying ABIST start Grant 6,629,280 - Koprowski , et al. September 30, 2	2003-09-30
VLSI chip test power reduction App 20030145263 - Song, Peilin ; et al.	2003-07-31
Pseudo random optimized built-in self-test App 20030140293 - Motika, Franco ; et al.	2003-07-24
Logic built-in self test selective signature generation Grant 6,442,723 - Koprowski , et al. August 27, 2	2002-08-27
Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis Grant 6,442,720 - Koprowski , et al. August 27, 2	2002-08-27
Logic built-in self test Grant 6,327,685 - Koprowski , et al. December 4, 2	2001-12-04
Isolation/removal of faults during LBIST testing Grant 6,125,465 - McNamara , et al. September 26, 2	2000-09-26

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