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Patent applications and USPTO patent grants for Koppel; Louis N..The latest application filed is for "calibration and alignment of x-ray reflectometric systems".
Patent | Date |
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Calibration and alignment of X-ray reflectometric systems Grant 6,987,832 - Koppel , et al. January 17, 2 | 2006-01-17 |
Calibration and alignment of X-ray reflectometric systems App 20040218717 - Koppel, Louis N. ;   et al. | 2004-11-04 |
Detector-shield assembly for X-ray reflectometric system Grant 6,770,886 - Koppel , et al. August 3, 2 | 2004-08-03 |
Calibration and alignment of X-ray reflectometric systems Grant 6,768,785 - Koppel , et al. July 27, 2 | 2004-07-27 |
X-ray reflectance measurement system with adjustable resolution Grant 6,744,850 - Fanton , et al. June 1, 2 | 2004-06-01 |
Calibration and alignment of X-ray reflectometric systems App 20040052330 - Koppel, Louis N. ;   et al. | 2004-03-18 |
Calibration and alignment of X-ray reflectometric systems Grant 6,643,354 - Koppel , et al. November 4, 2 | 2003-11-04 |
System and method for X-ray reflectometry measurement of low density films Grant 6,507,634 - Koppel , et al. January 14, 2 | 2003-01-14 |
Calibration and alignment of X-ray reflectometric systems Grant 6,453,006 - Koppel , et al. September 17, 2 | 2002-09-17 |
Calibration and alignment of X-ray reflectometric systems App 20020110218 - Koppel, Louis N. ;   et al. | 2002-08-15 |
X-ray reflectance measurement system with adjustable resolution App 20020097837 - Fanton, Jeffrey T. ;   et al. | 2002-07-25 |
X-ray thickness gauge Grant 5,619,548 - Koppel April 8, 1 | 1997-04-08 |
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