loadpatents
name:-0.0084619522094727
name:-0.15650701522827
name:-0.00078392028808594
Koppel; Louis N. Patent Filings

Koppel; Louis N.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Koppel; Louis N..The latest application filed is for "calibration and alignment of x-ray reflectometric systems".

Company Profile
0.8.4
  • Koppel; Louis N. - Menlo Park CA
  • Koppel; Louis N. - Redwood City CA
  • Koppel; Louis N. - San Jose CA
  • Koppel; Louis N. - Palo Alto CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Calibration and alignment of X-ray reflectometric systems
Grant 6,987,832 - Koppel , et al. January 17, 2
2006-01-17
Calibration and alignment of X-ray reflectometric systems
App 20040218717 - Koppel, Louis N. ;   et al.
2004-11-04
Detector-shield assembly for X-ray reflectometric system
Grant 6,770,886 - Koppel , et al. August 3, 2
2004-08-03
Calibration and alignment of X-ray reflectometric systems
Grant 6,768,785 - Koppel , et al. July 27, 2
2004-07-27
X-ray reflectance measurement system with adjustable resolution
Grant 6,744,850 - Fanton , et al. June 1, 2
2004-06-01
Calibration and alignment of X-ray reflectometric systems
App 20040052330 - Koppel, Louis N. ;   et al.
2004-03-18
Calibration and alignment of X-ray reflectometric systems
Grant 6,643,354 - Koppel , et al. November 4, 2
2003-11-04
System and method for X-ray reflectometry measurement of low density films
Grant 6,507,634 - Koppel , et al. January 14, 2
2003-01-14
Calibration and alignment of X-ray reflectometric systems
Grant 6,453,006 - Koppel , et al. September 17, 2
2002-09-17
Calibration and alignment of X-ray reflectometric systems
App 20020110218 - Koppel, Louis N. ;   et al.
2002-08-15
X-ray reflectance measurement system with adjustable resolution
App 20020097837 - Fanton, Jeffrey T. ;   et al.
2002-07-25
X-ray thickness gauge
Grant 5,619,548 - Koppel April 8, 1
1997-04-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed