Koop; Erik Johan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Koop; Erik Johan.The latest application filed is for "method of measuring a parameter of a lithographic process, metrology apparatus".

Company Profile

5.7.7

Koop; Erik Johan - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of determining a height profile, a measurement system and a computer readable medium Grant 11,137,695 - Donkerbroek , et al. October 5, 2	2021-10-05
Method of measuring a parameter of a lithographic process, metrology apparatus Grant 11,099,489 - Cramer , et al. August 24, 2	2021-08-24
Method of Measuring a Parameter of a Lithographic Process, Metrology Apparatus App 20200192231 - CRAMER; Hugo Augustinus Joseph ; et al.	2020-06-18
Methods for controlling lithographic apparatus, lithographic apparatus and device manufacturing method Grant 10,558,130 - Queens , et al. Feb	2020-02-11
Method of measuring a property of a substrate, inspection apparatus, lithographic system and device manufacturing method Grant 10,474,043 - Warnaar , et al. Nov	2019-11-12
A Method Of Determining A Height Profile, A Measurement System And A Computer Readable Medium App 20190294060 - DONKERBROEK; Arend Johannes ; et al.	2019-09-26
Methods For Controlling Lithographic Apparatus, Lithographic Apparatus And Device Manufacturing Method App 20190212664 - Queens; Rene Marinus Gerardus Johan ; et al.	2019-07-11
Methods for controlling lithographic apparatus, lithographic apparatus and device manufacturing method Grant 10,274,849 - Queens , et al.	2019-04-30
Methods For Controlling Lithographic Apparatus, Lithographic Apparatus And Device Manufacturing Method App 20180210351 - QUEENS; Rene Marinus Gerardus Johan ; et al.	2018-07-26
Method of Measuring a Property of a Substrate, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20180173105 - Warnaar; Patrick ; et al.	2018-06-21
Level sensor, a method for determining a height map of a substrate using a selected resolution, and a lithographic apparatus Grant 9,488,465 - Khuat Duy , et al. November 8, 2	2016-11-08
Level Sensor, a Method for Determining a Height Map of a Substrate, and a Lithographic Apparatus App 20130128247 - KHUAT DUY; Laurent ; et al.	2013-05-23
Method for determining exposure settings, lithographic exposure apparatus, computer program and data carrier Grant 8,208,118 - Burry , et al. June 26, 2	2012-06-26
Method for Determining Exposure Settings, Lithographic Exposure Apparatus, Computer Program and Data Carrier App 20090201473 - BURRY; David Warren ; et al.	2009-08-13

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