Konno; Mitsuru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Konno; Mitsuru.The latest application filed is for "scanning electron microscope".
- Konno; Mitsuru - Tokyo JP
- Konno; Mitsuru - Hitachinaka JP
- Konno; Mitsuru - Osaka JP
| Patent | Date |
|---|---|
| Scanning electron microscope Grant 9,040,911 - Ogashiwa , et al. May 26, 2 | 2015-05-26 |
| Scanning Electron Microscope App 20150108351 - Ogashiwa; Takeshi ; et al. | 2015-04-23 |
| Focused ion beam system and a method of sample preparation and observation Grant 7,612,337 - Suzuki , et al. November 3, 2 | 2009-11-03 |
| Focused ion beam system and a method of sample preparation and observation App 20070187597 - Suzuki; Yuya ; et al. | 2007-08-16 |
| Crosslinked molding, sound medium using it and ultrasonic coupler Grant 5,318,035 - Konno , et al. June 7, 1 | 1994-06-07 |
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