Konecky; Soren

Patent Applications and Registrations

Patent applications and USPTO patent grants for Konecky; Soren.The latest application filed is for "dual wavelength imaging and out of sample optical imaging".

Company Profile

7.5.10

Konecky; Soren - Alameda CA
Konecky; Soren - Irvine CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Dual wavelength imaging and out of sample optical imaging Grant 11,259,706 - Konecky , et al. March 1, 2	2022-03-01
Dual Wavelength Imaging and Out of Sample Optical Imaging App 20210364429 - Konecky; Soren ; et al.	2021-11-25
Imaging With Scattering Layer App 20210361168 - Konecky; Soren	2021-11-25
Optical Imaging from Light Coherence App 20210330202 - Konecky; Soren	2021-10-28
System for Optical Imaging with Unshifted Reference Beam App 20210153742 - Morales Delgado; Edgar Emilio ; et al.	2021-05-27
Optical Imaging with Unshifted Reference Beam App 20210153743 - Morales Delgado; Edgar Emilio ; et al.	2021-05-27
Defect classification by fitting optical signals to a point-spread function Grant 10,957,035 - Konecky , et al. March 23, 2	2021-03-23
Defect Classification by Fitting Optical Signals to a Point-Spread Function App 20200175664 - Konecky; Soren ; et al.	2020-06-04
Aided image reconstruction Grant 10,621,718 - Konecky , et al.	2020-04-14
Design Aided Image Reconstruction App 20190295237 - Konecky; Soren ; et al.	2019-09-26
System and method for defining care areas in repeating structures of design data Grant 10,339,262 - Huang , et al.	2019-07-02
Sub-pixel and sub-resolution localization of defects on patterned wafers Grant 9,875,536 - Konecky January 23, 2	2018-01-23
System and Method for Defining Care Areas in Repeating Structures of Design Data App 20170286589 - Huang; Junqing ; et al.	2017-10-05
Spatial Frequency Domain Imaging Using Custom Patterns App 20160309068 - Nadeau; Kyle ; et al.	2016-10-20
Sub-Pixel and Sub-Resolution Localization of Defects on Patterned Wafers App 20160292840 - Konecky; Soren	2016-10-06

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