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name:-0.004741907119751
name:-0.014157056808472
name:-0.0018138885498047
Kondo; Noriyuki Patent Filings

Kondo; Noriyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kondo; Noriyuki.The latest application filed is for "breaking apparatus and breaking method for substrate made of brittle material".

Company Profile
0.11.3
  • Kondo; Noriyuki - Suita N/A JP
  • Kondo; Noriyuki - Suita-city JP
  • Kondo; Noriyuki - Kyoto JP
  • Kondo; Noriyuki - Aichi-ken JP
  • Kondo; Noriyuki - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Breaking apparatus and breaking method for substrate made of brittle material
Grant 8,899,459 - Kondo , et al. December 2, 2
2014-12-02
Breaking Apparatus And Breaking Method For Substrate Made Of Brittle Material
App 20110266325 - Kondo; Noriyuki ;   et al.
2011-11-03
Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness
Grant 7,206,074 - Fujimoto , et al. April 17, 2
2007-04-17
Brake hose
Grant 7,140,395 - Furui , et al. November 28, 2
2006-11-28
Brake Hose
App 20060213568 - Furui; Kenichiro ;   et al.
2006-09-28
Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness
App 20050206907 - Fujimoto, Hiroki ;   et al.
2005-09-22
Moving image judging
Grant 6,104,864 - Kondo , et al. August 15, 2
2000-08-15
Method of and apparatus for evaluating crystal rate in silicon thin film
Grant 5,314,831 - Hirae , et al. May 24, 1
1994-05-24
Method of and apparatus for measuring film thickness
Grant 5,120,966 - Kondo * June 9, 1
1992-06-09
Method of measuring thickness of film with a reference sample having a known reflectance
Grant 5,101,111 - Kondo March 31, 1
1992-03-31
Method of and apparatus for measuring film thickness
Grant 4,984,894 - Kondo January 15, 1
1991-01-15
Film thickness measuring device and method
Grant 4,676,647 - Kikkawa , et al. June 30, 1
1987-06-30
Line width measuring device and method
Grant 4,659,936 - Kikkawa , et al. April 21, 1
1987-04-21

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