Kondo; Naoaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kondo; Naoaki.The latest application filed is for "wafer observation apparatus and wafer observation method".

Company Profile

9.6.7

Kondo; Naoaki - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Sample observation device and sample observation method Grant 11,170,483 - Harada , et al. November 9, 2	2021-11-09
Defect observation device and defect observation method Grant 11,087,454 - Kondo , et al. August 10, 2	2021-08-10
Wafer observation device Grant 10,977,786 - Kondo , et al. April 13, 2	2021-04-13
Defect observation system and defect observation method for semiconductor wafer Grant 10,971,325 - Harada , et al. April 6, 2	2021-04-06
Wafer Observation Apparatus And Wafer Observation Method App 20200411345 - Kondo; Naoaki ; et al.	2020-12-31
Defect classification apparatus and defect classification method Grant 10,810,733 - Kondo , et al. October 20, 2	2020-10-20
Sample Observation Device And Sample Observation Method App 20200126201 - HARADA; Minoru ; et al.	2020-04-23
Defect Observation System And Defect Observation Method For Semiconductor Wafer App 20200083017 - HARADA; Minoru ; et al.	2020-03-12
Sample observation device and sample observation method Grant 10,559,074 - Harada , et al. Feb	2020-02-11
Defect Observation Device And Defect Observation Method App 20200034957 - KONDO; Naoaki ; et al.	2020-01-30
Wafer Observation Device App 20190266713 - KONDO; Naoaki ; et al.	2019-08-29
Defect Classification Apparatus And Defect Classification Method App 20190139210 - KONDO; Naoaki ; et al.	2019-05-09
Sample Observation Device And Sample Observation Method App 20180240225 - HARADA; Minoru ; et al.	2018-08-23

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