KOMURO; Hitoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for KOMURO; Hitoshi.The latest application filed is for "unit and image forming apparatus".
Company Profile
0.22.20
- KOMURO; Hitoshi - Ebina-shi JP
- Komuro; Hitoshi - Kanagawa JP
- Komuro; Hitoshi - Hitachinaka JP
- Komuro; Hitoshi - Ebina N/A JP
- Komuro; Hitoshi - Minamiashigara JP
- Komuro; Hitoshi - Minamiashigara-shi JP
- Komuro, Hitoshi - Hitachinaka-shi JP
- Komuro; Hitoshi - Saitama JP
- Komuro; Hitoshi - Okoze-higashi JP
Patent Activity
| Patent | Date |
|---|---|
| Unit And Image Forming Apparatus App 20220244653 - KAMIJO; Yukiko ; et al. | 2022-08-04 |
| Fixing device, and image forming apparatus Grant 9,128,436 - Komuro September 8, 2 | 2015-09-08 |
| Fixing Device, And Image Forming Apparatus App 20140294457 - KOMURO; Hitoshi | 2014-10-02 |
| Method for measuring sample and measurement device Grant 8,581,187 - Kijima , et al. November 12, 2 | 2013-11-12 |
| Pattern measuring method and pattern measuring device Grant 8,507,856 - Sutani , et al. August 13, 2 | 2013-08-13 |
| Belt pressurizing device and image forming apparatus Grant 8,428,500 - Komuro April 23, 2 | 2013-04-23 |
| Fixing device, image forming apparatus and method of controlling fixing device Grant 8,326,200 - Komuro December 4, 2 | 2012-12-04 |
| Pattern Measuring Method And Pattern Measuring Device App 20120211653 - SUTANI; Takumichi ; et al. | 2012-08-23 |
| Pattern matching method and computer program for executing pattern matching Grant 8,244,042 - Sugiyama , et al. August 14, 2 | 2012-08-14 |
| Recipe generation system and method Grant 8,189,040 - Fujita , et al. May 29, 2 | 2012-05-29 |
| Fixing Device And Image Forming Apparatus App 20120076556 - KOMURO; Hitoshi | 2012-03-29 |
| Method, device and computer program of length measurement Grant 8,019,161 - Morokuma , et al. September 13, 2 | 2011-09-13 |
| Belt Pressurizing Device And Image Forming Apparatus App 20110206426 - KOMURO; Hitoshi | 2011-08-25 |
| Pattern Matching Method And Computer Program For Executing Pattern Matching App 20110150345 - SUGIYAMA; Akiyuki ; et al. | 2011-06-23 |
| Method For Measuring Sample And Measurement Device App 20110139982 - Kijima; Mihoko ; et al. | 2011-06-16 |
| Pattern matching method and computer program for executing pattern matching Grant 7,925,095 - Sugiyama , et al. April 12, 2 | 2011-04-12 |
| Pattern matching method and pattern matching program Grant 7,889,909 - Shindo , et al. February 15, 2 | 2011-02-15 |
| Fixing Device, Image Forming Apparatus And Method Of Controlling Fixing Device App 20100316421 - KOMURO; Hitoshi | 2010-12-16 |
| Pattern Measuring Method And Pattern Measuring Device App 20090200465 - SUTANI; Takumichi ; et al. | 2009-08-13 |
| Pattern measuring method and pattern measuring device Grant 7,518,110 - Sutani , et al. April 14, 2 | 2009-04-14 |
| Recipe Generation System and Method App 20090062934 - FUJITA; Hiromi ; et al. | 2009-03-05 |
| Fixing device, sheet member, and image forming apparatus Grant 7,493,074 - Komuro February 17, 2 | 2009-02-17 |
| Pattern matching method and computer program for executing pattern matching App 20080037830 - Sugiyama; Akiyuki ; et al. | 2008-02-14 |
| Workpiece size measurement method and apparatus App 20070221842 - Morokuma; Hidetoshi ; et al. | 2007-09-27 |
| Pattern matching method and pattern matching program App 20070223803 - Shindo; Hiroyuki ; et al. | 2007-09-27 |
| Circulating body and fixing device Grant 7,133,634 - Komuro , et al. November 7, 2 | 2006-11-07 |
| Fixing device, sheet member, and image forming apparatus App 20060216077 - Komuro; Hitoshi | 2006-09-28 |
| Pattern measuring method and pattern measuring device App 20060193508 - Sutani; Takumichi ; et al. | 2006-08-31 |
| Review work supporting system Grant 6,978,041 - Isogai , et al. December 20, 2 | 2005-12-20 |
| Investigation device and investigation method Grant 6,968,079 - Yoshikawa , et al. November 22, 2 | 2005-11-22 |
| Circulating body and fixing device App 20050013639 - Komuro, Hitoshi ; et al. | 2005-01-20 |
| Defect inspection method and apparatus for silicon wafer Grant 6,683,683 - Tomita , et al. January 27, 2 | 2004-01-27 |
| Review work supporting system App 20020196968 - Isogai, Seiji ; et al. | 2002-12-26 |
| Defect inspection method and apparatus for silicon wafer App 20020080344 - Tomita, Koji ; et al. | 2002-06-27 |
| Investigation device and investigation method App 20020001404 - Yoshikawa, Akira ; et al. | 2002-01-03 |
| Defect inspection method and apparatus for silicon wafer App 20010015802 - Tomita, Koji ; et al. | 2001-08-23 |
| Defect inspection apparatus for silicon wafer Grant 6,157,444 - Tomita , et al. December 5, 2 | 2000-12-05 |
| First-in first-out article storage rack apparatus Grant 5,314,078 - Morikiyo , et al. May 24, 1 | 1994-05-24 |
| Basket in basket conveyor Grant 5,096,047 - Morikiyo , et al. March 17, 1 | 1992-03-17 |
Company Registrations
| NCAGE Code | 57ZG0 | KOMURO, HITOSHI |
| CAGE Code | 57ZG0 | KOMURO, HITOSHI |
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