Komoto; Yoshio
Patent Applications and Registrations
Patent applications and USPTO patent grants for Komoto; Yoshio.The latest application filed is for "test apparatus, test method and manufacturing method".
- Komoto; Yoshio - Gunma N/A JP
- Komoto; Yoshio - San Jose CA
| Patent | Date |
|---|---|
| Test wafer unit and test system Grant 8,749,260 - Tokunaga , et al. June 10, 2 | 2014-06-10 |
| Apparatus and method for manufacturing a packaged device Grant 8,667,669 - Komoto March 11, 2 | 2014-03-11 |
| Test apparatus, test method and manufacturing method for testing a device under test packaged in a test package Grant 8,652,857 - Komoto February 18, 2 | 2014-02-18 |
| Test system and write wafer Grant 8,624,620 - Tokunaga , et al. January 7, 2 | 2014-01-07 |
| Probe wafer, probe device, and testing system Grant 8,427,187 - Komoto , et al. April 23, 2 | 2013-04-23 |
| Test system and probe apparatus Grant 8,410,807 - Umemura , et al. April 2, 2 | 2013-04-02 |
| Test wafer unit and test system Grant 8,289,040 - Komoto , et al. October 16, 2 | 2012-10-16 |
| Probe apparatus and test apparatus Grant 8,253,428 - Komoto August 28, 2 | 2012-08-28 |
| Test Apparatus, Test Method And Manufacturing Method App 20120214261 - Komoto; Yoshio | 2012-08-23 |
| Manufacturing Apparatus, Manufacturing Method And Packaged Device App 20120205143 - KOMOTO; Yoshio | 2012-08-16 |
| Probe wafer, probe device, and testing system Grant 8,134,379 - Komoto , et al. March 13, 2 | 2012-03-13 |
| Test Wafer Unit And Test System App 20110133768 - TOKUNAGA; Yasuo ; et al. | 2011-06-09 |
| Probe Wafer, Probe Device, And Testing System App 20110121848 - KOMOTO; Yoshio ; et al. | 2011-05-26 |
| Test System And Write Wafer App 20110115519 - TOKUNAGA; Yasuo ; et al. | 2011-05-19 |
| Probe Wafer, Probe Device, And Testing System App 20110109337 - KOMOTO; Yoshio ; et al. | 2011-05-12 |
| Test Wafer Unit And Test System App 20110095777 - KOMOTO; Yoshio ; et al. | 2011-04-28 |
| Probe Apparatus And Test Apparatus App 20110074456 - KOMOTO; Yoshio | 2011-03-31 |
| Test System And Probe Apparatus App 20110062979 - UMEMURA; Yoshiharu ; et al. | 2011-03-17 |
| Semiconductor test system linked to cad data Grant 5,740,086 - Komoto April 14, 1 | 1998-04-14 |
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