Komori; Masaaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Komori; Masaaki.The latest application filed is for "semiconductor inspection device".

Company Profile

5.10.14

Komori; Masaaki - Tokyo JP
Komori; Masaaki - Hitachinaka JP
Komori; Masaaki - Kokubunji JP
Komori, Masaaki - Kokubunji-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe module and probe Grant 11,391,756 - Hirano , et al. July 19, 2	2022-07-19
Semiconductor Inspection Device App 20210270891 - KOMORI; Masaaki ; et al.	2021-09-02
Semiconductor Inspection Device and Probe Unit App 20210263075 - KOMORI; Masaaki ; et al.	2021-08-26
Method for Manufacturing Semiconductor Device App 20210048450 - OHTAKI; Tomohisa ; et al.	2021-02-18
Probe Module and Probe App 20210033642 - HIRANO; Ryo ; et al.	2021-02-04
Evaluation Apparatus for Semiconductor Device App 20210025936 - OHTAKI; Tomohisa ; et al.	2021-01-28
Dynamic response analysis prober device Grant 10,782,340 - Komori , et al. Sept	2020-09-22
Control device for electric motor and hydraulic pressure supply system Grant 10,746,171 - Komori , et al. A	2020-08-18
Control Device For Electric Motor And Hydraulic Pressure Supply System App 20180347416 - KOMORI; Masaaki ; et al.	2018-12-06
Dynamic Response Analysis Prober Device App 20180299504 - KOMORI; Masaaki ; et al.	2018-10-18
Specimen inspection equipment and how to make the electron beam absorbed current images Grant 8,178,840 - Obuki , et al. May 15, 2	2012-05-15
Method And Apparatus For Inspecting Semiconductor Using Absorbed Current Image App 20110291692 - Ando; Tohru ; et al.	2011-12-01
Inspection apparatus having a heating mechanism for performing sample temperature regulation Grant 8,040,146 - Sunaoshi , et al. October 18, 2	2011-10-18
Inspection Apparatus And Method App 20100123474 - Sunaoshi; Takeshi ; et al.	2010-05-20
Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images App 20100116986 - Obuki; Tomoharu ; et al.	2010-05-13
Inspection apparatus and method Grant 7,663,390 - Sunaoshi , et al. February 16, 2	2010-02-16
Specimen inspection equipment and how to make electron beam absorbed current images Grant 7,663,104 - Obuki , et al. February 16, 2	2010-02-16
Inspection Apparatus And Method App 20090009203 - SUNAOSHI; Takeshi ; et al.	2009-01-08
Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images App 20080203297 - OBUKI; Tomoharu ; et al.	2008-08-28
Optical transmission device Grant 6,606,443 - Sato , et al. August 12, 2	2003-08-12
Optical transmission device App 20030007765 - Sato, Hiroshi ; et al.	2003-01-09
Semiconductor laser device, semiconductor laser array device and optical fiber transmission system App 20010006529 - Komori, Masaaki ; et al.	2001-07-05
Semiconductor guided-wave optical device and method of fabricating thereof Grant 5,764,842 - Aoki , et al. June 9, 1	1998-06-09
Process for producing an antibacterial ceramic material Grant 5,151,122 - Atsumi , et al. September 29, 1	1992-09-29

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