Komemura; Toshio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Komemura; Toshio.The latest application filed is for "device for examining end part".

Company Profile

0.5.4

Komemura; Toshio - Hyogo JP
Komemura; Toshio - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Plasma processing apparatus capable of evaluating process performance Grant 6,929,712 - Hanazaki , et al. August 16, 2	2005-08-16
Device for examining end part App 20050024630 - Ohno, Toshiki ; et al.	2005-02-03
Defect inspecting device for substrate to be processed and method of manufacturing semiconductor device Grant 6,768,542 - Ise , et al. July 27, 2	2004-07-27
Conveyor, method for conveying a semiconductor wafer, and method for manufacturing a semiconductor device Grant 6,648,128 - Yamashita , et al. November 18, 2	2003-11-18
Plasma processing apparatus capable of evaluating process performance App 20030178140 - Hanazaki, Minoru ; et al.	2003-09-25
Defect inspecting device for substrate to be processed and method of manufacturing semiconductor device App 20030053046 - Ise, Hirotoshi ; et al.	2003-03-20
Conveyor, method for conveying a semiconductor wafer, and method for manufacturing a semiconductor device App 20030042115 - Yamashita, Toshihiro ; et al.	2003-03-06
Plasma generating apparatus with multiple microwave introducing means Grant 6,109,208 - Tsuchihashi , et al. August 29, 2	2000-08-29
Magnetically enhanced microwave plasma generating apparatus Grant 6,054,016 - Tuda , et al. April 25, 2	2000-04-25

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