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name:-0.0091290473937988
name:-0.00052094459533691
Komatsu; Yasuaki Patent Filings

Komatsu; Yasuaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Komatsu; Yasuaki.The latest application filed is for "removing effects of instabilities of measurement system".

Company Profile
0.8.5
  • Komatsu; Yasuaki - Hyogo JP
  • Komatsu; Yasuaki - Kobe JP
  • Komatsu; Yasuaki - Kobe-shi JP
  • Komatsu; Yasuaki - Kobeshi JP
  • Komatsu; Yasuaki - Hachioji JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Removing effects of instabilities of measurement system
Grant 11,209,471 - Dunsmore , et al. December 28, 2
2021-12-28
Removing Effects Of Instabilities Of Measurement System
App 20210341526 - Dunsmore; Joel P. ;   et al.
2021-11-04
Method to verify the outcome of calibration with a network analyzer
Grant 7,474,975 - Komatsu January 6, 2
2009-01-06
Method of measuring frequency translation device
Grant 7,415,373 - Yanamaka , et al. August 19, 2
2008-08-19
Network analyzing apparatus and test method
Grant 7,298,158 - Komatsu November 20, 2
2007-11-20
Method to verify the outcome of calibration with a network analyzer
App 20070233410 - Komatsu; Yasuaki
2007-10-04
Method of measuring frequency translation device
App 20060004919 - Yanamaka; Haruhiko ;   et al.
2006-01-05
Method to verify the outcome of calibration with a network analyzer
App 20050140377 - Komatsu, Yasuaki
2005-06-30
Network analyzing apparatus and test method
App 20040249605 - Komatsu, Yasuaki
2004-12-09
Frequency divider with shift register and modulator
Grant 5,754,067 - Komatsu , et al. May 19, 1
1998-05-19
Electric power measuring apparatus and method
Grant 5,508,617 - Komatsu April 16, 1
1996-04-16
Contact judging circuit and contact judging method for impedance measuring apparatus
Grant 5,416,470 - Tanaka , et al. May 16, 1
1995-05-16
Apparatus which uses a simulated inductor in the measurement of an electrical parameter of a device under test
Grant 4,885,528 - Tanaka , et al. December 5, 1
1989-12-05

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