Komai; Yutaka
Patent Applications and Registrations
Patent applications and USPTO patent grants for Komai; Yutaka.The latest application filed is for "synchronous semiconductor integrated circuit device capable of test time reduction".
- Komai; Yutaka - Ibaraki JP
- Komai; Yutaka - Tsuchiuraq JP
| Patent | Date |
|---|---|
| Synchronous semiconductor integrated circuit device capable of test time reduction Grant 6,385,125 - Ooishi , et al. May 7, 2 | 2002-05-07 |
| Synchronous Semiconductor Integrated Circuit Device Capable Of Test Time Reduction App 20020051404 - OOISHI, TSUKASA ; et al. | 2002-05-02 |
| Testing and repair of wide I/O semiconductor memory devices designed for testing Grant 5,706,234 - Pilch, Jr. , et al. January 6, 1 | 1998-01-06 |
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