loadpatents
name:-0.01353907585144
name:-0.013233184814453
name:-0.00077009201049805
Kolvenbach; Kevin Patent Filings

Kolvenbach; Kevin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kolvenbach; Kevin.The latest application filed is for "non-planar field effect transistor test structure and lateral dielectric breakdown testing method".

Company Profile
0.7.5
  • Kolvenbach; Kevin - Walden NY
  • Kolvenbach; Kevin - Hopewell Junction NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Non-planar field effect transistor test structure and lateral dielectric breakdown testing method
Grant 9,453,873 - Chen , et al. September 27, 2
2016-09-27
Electromigration immune through-substrate vias
Grant 9,153,558 - Filippi , et al. October 6, 2
2015-10-06
Non-planar Field Effect Transistor Test Structure And Lateral Dielectric Breakdown Testing Method
App 20150198654 - Chen; Fen ;   et al.
2015-07-16
Electromigration Immune Through-substrate Vias
App 20120292763 - Filippi; Ronald G. ;   et al.
2012-11-22
Electromigration immune through-substrate vias
Grant 8,304,863 - Filippi , et al. November 6, 2
2012-11-06
Electromigration Immune Through-substrate Vias
App 20110193199 - Filippi; Ronald G. ;   et al.
2011-08-11
Structure and methodology for characterizing device self-heating
Grant 7,805,274 - Wang , et al. September 28, 2
2010-09-28
Method and apparatus for dynamic characterization of reliability wearout mechanisms
Grant 7,710,141 - La Rosa , et al. May 4, 2
2010-05-04
Method And Apparatus For Dynamic Characterization Of Reliability Wearout Mechanisms
App 20090167336 - La Rosa; Giuseppe ;   et al.
2009-07-02
Structure And Methodology For Characterizing Device Self-heating
App 20080112458 - Wang; Ping-Chuan ;   et al.
2008-05-15
Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring
Grant 6,476,632 - La Rosa , et al. November 5, 2
2002-11-05

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