Kollhof; Dietmar
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kollhof; Dietmar.The latest application filed is for "method for detection of defects in the inspection of structured surfaces".
- Kollhof; Dietmar - Ilmenau DE
| Patent | Date |
|---|---|
| Method for detection of defects in the inspection of structured surfaces Grant 6,075,880 - Kollhof , et al. June 13, 2 | 2000-06-13 |
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