Patent | Date |
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Testing Apparatus App 20180364131 - Jokinen; Kimmo ;   et al. | 2018-12-20 |
Method for partitioning a pattern into optimized sub-patterns Grant 9,147,252 - Davis , et al. September 29, 2 | 2015-09-29 |
Method For Partitioning A Pattern Into Optimized Sub-patterns App 20120155768 - Davis; Jason ;   et al. | 2012-06-21 |
Image preprocessing for probe mark inspection Grant 8,189,904 - Wallack , et al. May 29, 2 | 2012-05-29 |
Method for partitioning a pattern into optimized sub-patterns Grant 8,081,820 - Davis , et al. December 20, 2 | 2011-12-20 |
Image Preprocessing For Probe Mark Inspection App 20110058730 - Wallack; Aaron ;   et al. | 2011-03-10 |
Image preprocessing for probe mark inspection Grant 7,885,453 - Wallack , et al. February 8, 2 | 2011-02-08 |
Image preprocessing for probe mark inspection Grant 7,242,801 - Wallack , et al. July 10, 2 | 2007-07-10 |
Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object Grant 7,162,073 - Akgul , et al. January 9, 2 | 2007-01-09 |
Method for extracting features from an image using oriented filters Grant 6,983,065 - Akgul , et al. January 3, 2 | 2006-01-03 |
Method for partitioning a pattern into optimized sub-patterns App 20050117801 - Davis, Jason ;   et al. | 2005-06-02 |
Method and apparatus for determining a reference point of a bottle bottom in an image Grant 6,801,649 - Michael , et al. October 5, 2 | 2004-10-05 |
Method for locating features on an object using varied illumination Grant 6,768,812 - Koljonen July 27, 2 | 2004-07-27 |
Apparatus for locating features of an object using varied illumination Grant 6,681,037 - Koljonen January 20, 2 | 2004-01-20 |
Method and apparatus for focusing an optical inspection system Grant 6,636,298 - Bachelder , et al. October 21, 2 | 2003-10-21 |
Method and apparatus for determining a reference point of an object profile within an image Grant 6,249,602 - Michael , et al. June 19, 2 | 2001-06-19 |
Methods and apparatuses for in-line solder paste inspection Grant 5,982,927 - Koljonen November 9, 1 | 1999-11-09 |
Method and apparatus for in-line solder paste inspection Grant 5,912,984 - Michael , et al. June 15, 1 | 1999-06-15 |
Apparatus for automated optical inspection objects Grant 5,861,909 - Garakani , et al. January 19, 1 | 1999-01-19 |
Method and apparatus to locate and measure capillary indentation marks on wire bonded leads Grant 5,835,622 - Koljonen , et al. November 10, 1 | 1998-11-10 |
Template rotating method for locating bond pads in an image Grant 5,757,956 - Koljonen , et al. May 26, 1 | 1998-05-26 |
Automated optical inspection apparatus Grant 5,640,199 - Garakani , et al. June 17, 1 | 1997-06-17 |
Method and apparatus for ball bond inspection system Grant 5,581,632 - Koljonen , et al. December 3, 1 | 1996-12-03 |
Using cone shaped search models to locate ball bonds on wire bonded devices Grant 5,550,763 - Michael , et al. August 27, 1 | 1996-08-27 |
Automated optical inspection apparatus Grant 5,532,739 - Garakani , et al. July 2, 1 | 1996-07-02 |