loadpatents
name:-0.34069395065308
name:-0.0082149505615234
name:-0.0033910274505615
Kojiri; Hidehiro Patent Filings

Kojiri; Hidehiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kojiri; Hidehiro.The latest application filed is for "method of forming film stacks with reduced defects".

Company Profile
2.14.17
  • Kojiri; Hidehiro - Sunnyvale CA
  • Kojiri; Hidehiro - Narita Chiba JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of forming film stacks with reduced defects
Grant 11,145,504 - Jiang , et al. October 12, 2
2021-10-12
RPS defect reduction by cyclic clean induced RPS cooling
Grant 10,755,903 - Bhatia , et al. A
2020-08-25
Method Of Forming Film Stacks With Reduced Defects
App 20200227258 - JIANG; Zhijun ;   et al.
2020-07-16
Rps Defect Reduction By Cyclic Clean Induced Rps Cooling
App 20170207069 - BHATIA; Sidharth ;   et al.
2017-07-20
Method of forming a group III-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (HVPE)
Grant 9,431,477 - Kryliouk , et al. August 30, 2
2016-08-30
Methods for improved growth of group III nitride semiconductor compounds
Grant 8,980,002 - Melnik , et al. March 17, 2
2015-03-17
Methods for pretreatment of group III-nitride depositions
Grant 8,853,086 - Melnik , et al. October 7, 2
2014-10-07
Methods for improved growth of group III nitride buffer layers
Grant 8,778,783 - Melnik , et al. July 15, 2
2014-07-15
Method Of Forming A Group Iii-nitride Crystalline Film On A Patterned Substrate By Hydride Vapor Phase Epitaxy (hvpe)
App 20130320353 - Kryiouk; Olga ;   et al.
2013-12-05
Method of forming a group III-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (HVPE)
Grant 8,507,304 - Kryliouk , et al. August 13, 2
2013-08-13
Methods For Pretreatment Of Group Iii-nitride Depositions
App 20120295428 - Melnik; Yuriy ;   et al.
2012-11-22
Methods For Improved Growth Of Group Iii Nitride Semiconductor Compounds
App 20120291698 - Melnik; Yuriy ;   et al.
2012-11-22
Methods For Improved Growth Of Group Iii Nitride Buffer Layers
App 20120295418 - Melnik; Yuriy ;   et al.
2012-11-22
Light Emitting Diode With Enhanced Quantum Efficiency And Method Of Fabrication
App 20120235116 - Su; Jie ;   et al.
2012-09-20
Substrate Pretreatment For Subsequent High Temperature Group Iii Depositions
App 20120156863 - MELNIK; Yuriy ;   et al.
2012-06-21
Substrate pretreatment for subsequent high temperature group III depositions
Grant 8,138,069 - Melnik , et al. March 20, 2
2012-03-20
Group Iii-nitride N-type Doping
App 20110263111 - Melnik; Yuriy ;   et al.
2011-10-27
Nano-spherical Group Iii-nitride Materials
App 20110140071 - Kryliouk; Olga ;   et al.
2011-06-16
Method Of Forming A Group Iii-nitride Crystalline Film On A Patterned Substrate By Hydride Vapor Phase Epitaxy (hvpe)
App 20110012109 - Kryliouk; Olga ;   et al.
2011-01-20
METHOD OF FORMING IN-SITU PRE-GaN DEPOSITION LAYER IN HVPE
App 20100279020 - Melnik; Yuriy ;   et al.
2010-11-04
Substrate Pretreatment For Subsequent High Temperature Group Iii Depositions
App 20100273318 - Melnik; Yuriy ;   et al.
2010-10-28
Chamber Plasma-cleaning Process Scheme
App 20100024840 - HSIEH; CHANG-LIN ;   et al.
2010-02-04
In-situ Chamber Cleaning Method
App 20090114245 - Kojiri; Hidehiro
2009-05-07
Precision dielectric etch using hexafluorobutadiene
Grant 6,800,213 - Ding , et al. October 5, 2
2004-10-05
Precision dielectric etch using hexafluorobutadiene
App 20030036287 - Ding, Ji ;   et al.
2003-02-20

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed