Koizumi; Mitsuyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Koizumi; Mitsuyoshi.The latest application filed is for "laser processing apparatus".

Company Profile

0.18.4

Koizumi; Mitsuyoshi - Yokohama JP
Koizumi; Mitsuyoshi - Saitama JP
Koizumi; Mitsuyoshi - Kodama-gun JP
Koizumi; Mitsuyoshi - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Laser Processing Apparatus App 20100167431 - YAMAGUCHI; Hironaru ; et al.	2010-07-01
Exposure Apparatus, Exposure Method, And Method Of Manufacturing Display Panel Substrate App 20100103397 - Nemoto; Ryouji ; et al.	2010-04-29
Exposure Appartus, Exposure Method And Method Of Manufacturing Display Panel Substrate App 20100060878 - NEMOTO; RYOUJI ; et al.	2010-03-11
Exposure Apparatus, Exposure Method And Method Of Manufacturing Display Panel Substrate App 20100040964 - NEMOTO; RYOUJI ; et al.	2010-02-18
Detachable lens block and video camera system including the same Grant 6,172,709 - Yamano , et al. January 9, 2	2001-01-09
Apparatus for detecting extraneous substances on a glass plate Grant 5,245,403 - Kato , et al. September 14, 1	1993-09-14
Method of inspecting defects in circuit pattern and system for carrying out the method Grant 5,146,509 - Hara , et al. September 8, 1	1992-09-08
Foreign particle detecting method and apparatus Grant RE33,991 - Shiba , et al. July 14, 1	1992-07-14
Method for detecting foreign matter and device for realizing same Grant 5,046,847 - Nakata , et al. September 10, 1	1991-09-10
Method and apparatus for detecting abnormal patterns Grant 4,952,058 - Noguchi , et al. August 28, 1	1990-08-28
Method and apparatus for correcting defects of X-ray mask Grant 4,933,565 - Yamaguchi , et al. June 12, 1	1990-06-12
Method of and apparatus for detecting foreign substance Grant 4,922,308 - Noguchi , et al. May 1, 1	1990-05-01
Method and apparatus for inspecting surface defects on the magnetic disk file memories Grant 4,674,875 - Koizumi June 23, 1	1987-06-23
Foreign particle detecting method and apparatus Grant 4,669,875 - Shiba , et al. June 2, 1	1987-06-02
Exposure apparatus and method of aligning exposure mask with workpiece Grant 4,668,089 - Oshida , et al. May 26, 1	1987-05-26
Automatic contaminants detection apparatus Grant 4,614,427 - Koizumi , et al. September 30, 1	1986-09-30
Apparatus for detecting contaminants on the reticle of exposure system Grant 4,541,715 - Akiyama , et al. September 17, 1	1985-09-17
Wafer transforming device Grant 4,504,045 - Kenbo , et al. March 12, 1	1985-03-12
Exposure process and system Grant 4,475,223 - Taniguchi , et al. October 2, 1	1984-10-02
Test apparatus for defects of plate Grant 4,460,273 - Koizumi , et al. July 17, 1	1984-07-17
Focusing position detecting device in optical magnifying and observing apparatus Grant 4,433,235 - Akiyama , et al. February 21, 1	1984-02-21
Method and apparatus for inspecting specimen surface Grant 4,423,331 - Koizumi , et al. December 27, 1	1983-12-27

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