loadpatents
name:-0.0065488815307617
name:-0.0088870525360107
name:-0.0005338191986084
Kohsaka; Yasuo Patent Filings

Kohsaka; Yasuo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kohsaka; Yasuo.The latest application filed is for "sputtering target".

Company Profile
0.8.4
  • Kohsaka; Yasuo - Yokohama JP
  • Kohsaka; Yasuo - Yokohama-shi JP
  • Kohsaka; Yasuo - Kanagawa JP
  • Kohsaka; Yasuo - Kanagawa-Ken JP
  • Kohsaka; Yasuo - Sakai JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Sputtering target
Grant 9,437,486 - Watanabe , et al. September 6, 2
2016-09-06
Sputtering Target
App 20120038050 - WATANABE; Koichi ;   et al.
2012-02-16
Tungsten sputtering target and method of manufacturing the target
Grant 7,718,117 - Watanabe , et al. May 18, 2
2010-05-18
Sputtering Target And Process For Producing The Same
App 20090134020 - Suzuki; Yukinobu ;   et al.
2009-05-28
Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film
Grant 7,153,589 - Kohsaka , et al. December 26, 2
2006-12-26
Tungsten sputtering target and method of manufacturing the target
App 20050029094 - Watanabe, Koichi ;   et al.
2005-02-10
Sputter target, barrier film and electronic component
Grant 6,750,542 - Suzuki , et al. June 15, 2
2004-06-15
Sputter target, barrier film and electronic component
App 20030116849 - Suzuki, Yukinobu ;   et al.
2003-06-26
Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film
Grant 5,913,100 - Kohsaka , et al. June 15, 1
1999-06-15
Method for measuring impurity concentrations in a liquid and an apparatus therefor
Grant 4,761,074 - Kohsaka , et al. August 2, 1
1988-08-02
Method for measuring the number of hyperfine particles and a measuring system therefor
Grant 4,449,816 - Kohsaka , et al. May 22, 1
1984-05-22

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