Kohr; Holger
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kohr; Holger.The latest application filed is for "dual beam bifocal charged particle microscope".
- Kohr; Holger - Eindhoven NL
| Patent | Date |
|---|---|
| Simultaneous TEM and STEM microscope Grant 11,404,241 - Henstra , et al. August 2, 2 | 2022-08-02 |
| Simultaneous Tem And Stem Microscope App 20210305012 - Henstra; Alexander ; et al. | 2021-09-30 |
| Electron Diffraction Holography App 20210302333 - Henstra; Alexander ; et al. | 2021-09-30 |
| Dual Beam Bifocal Charged Particle Microscope App 20210305007 - Henstra; Alexander ; et al. | 2021-09-30 |
| Method of imaging a sample using an electron microscope Grant 10,937,625 - Franken , et al. March 2, 2 | 2021-03-02 |
| Method and system for energy resolved chroma imaging Grant 10,923,308 - Deng , et al. February 16, 2 | 2021-02-16 |
| Method Of Imaging A Sample Using An Electron Microscope App 20200168433 - Franken; Erik Michiel ; et al. | 2020-05-28 |
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