Kohli; Kriteshwar K.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kohli; Kriteshwar K..The latest application filed is for "predictive navigation system".
- Kohli; Kriteshwar K. - White Plains NY
- Kohli; Kriteshwar K. - Fishkill NY
| Patent | Date |
|---|---|
| Predictive navigation system Grant 11,047,705 - Chakravarthi , et al. June 29, 2 | 2021-06-29 |
| Predictive Navigation System App 20210010821 - CHAKRAVARTHI; DIVYA KANNAN ; et al. | 2021-01-14 |
| Creating knowledge base for optical proximity correction to reduce sub-resolution assist feature printing Grant 10,386,714 - Kohli , et al. A | 2019-08-20 |
| Modified tungsten silicon Grant 10,192,822 - Ferrer , et al. Ja | 2019-01-29 |
| Creating Knowledge Base For Optical Proximity Correction To Reduce Sub-resolution Assist Feature Printing App 20180196340 - Kohli; Kriteshwar K. ; et al. | 2018-07-12 |
| Capacitance monitoring using x-ray diffraction Grant 10,008,421 - Kang , et al. June 26, 2 | 2018-06-26 |
| Capacitance Monitoring Using X-ray Diffraction App 20180096904 - Kang; Donghun ; et al. | 2018-04-05 |
| Non-destructive dielectric layer thickness and dopant measuring method Grant 9,892,979 - Kohli , et al. February 13, 2 | 2018-02-13 |
| Capacitance monitoring using X-ray diffraction Grant 9,870,960 - Kang , et al. January 16, 2 | 2018-01-16 |
| Non-destructive Dielectric Layer Thickness And Dopant Measuring Method App 20160372385 - Kohli; Kriteshwar K. ; et al. | 2016-12-22 |
| Modified Tungsten Silicon App 20160240478 - Ferrer; Domingo A. ; et al. | 2016-08-18 |
| Capacitance Monitoring Using X-ray Diffraction App 20160178679 - Kang; Donghun ; et al. | 2016-06-23 |
| Evaluating semiconductor wafers for pitch walking and/or epitaxial merge Grant 9,201,027 - Kohli , et al. December 1, 2 | 2015-12-01 |
| Evaluating Semiconductor Wafers For Pitch Walking And/or Epitaxial Merge App 20150233844 - Kohli; Kriteshwar K. ; et al. | 2015-08-20 |
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