Kohama; Yoshiaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kohama; Yoshiaki.The latest application filed is for "electron beam apparatus and device production method using the electron beam apparatus".

Company Profile

0.13.9

Kohama; Yoshiaki - Kawasaki JP
Kohama; Yoshiaki - Kanagawa JP
Kohama; Yoshiaki - Kawasaki-shi JP
Kohama; Yoshiaki - Tokyo JP
Kohama; Yoshiaki - Kanagawa-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Object observation apparatus and object observation Grant RE41,665 - Hamashima , et al. September 14, 2	2010-09-14
Electron beam apparatus and device production method using the electron beam apparatus Grant 7,439,502 - Nakasuji , et al. October 21, 2	2008-10-21
Electron beam apparatus and device production method using the electron beam apparatus App 20080173815 - Nakasuji; Mamoru ; et al.	2008-07-24
Object observation apparatus and object observation Grant RE40,221 - Hamashima , et al. April 8, 2	2008-04-08
Electron beam apparatus and device production method using the electron beam apparatus App 20070272859 - Nakasuji; Mamoru ; et al.	2007-11-29
Electron beam apparatus and device fabrication method using the electron beam apparatus Grant 7,244,932 - Nakasuji , et al. July 17, 2	2007-07-17
Electron beam apparatus, and inspection instrument and inspection process thereof App 20070034797 - Kohama; Yoshiaki	2007-02-15
Electron beam apparatus, and inspection instrument and inspection process thereof App 20060022138 - Kohama; Yoshiaki	2006-02-02
Electron beam apparatus, and inspection instrument and inspection process thereof Grant 6,958,477 - Kohama October 25, 2	2005-10-25
Scanning device and method including electric charge movement Grant 6,953,944 - Kohama , et al. October 11, 2	2005-10-11
Scanning device and method including electric charge movement App 20040238740 - Kohama, Yoshiaki ; et al.	2004-12-02
Electron beam apparatus, and inspection instrument and inspection process thereof App 20040106862 - Kohama, Yoshiaki	2004-06-03
Electron beam apparatus, and inspection instrument and inspection process thereof Grant 6,677,587 - Kohama January 13, 2	2004-01-13
Scanning device and scanning method Grant 6,670,602 - Kohama , et al. December 30, 2	2003-12-30
Electron beam apparatus, and inspection instrument and inspection process thereof App 20030085355 - Kohama, Yoshiaki	2003-05-08
Electron beam apparatus, and inspection instrument and inspection process thereof Grant 6,518,582 - Kohama February 11, 2	2003-02-11
Object observation apparatus and object observation Grant 6,479,819 - Hamashima , et al. November 12, 2	2002-11-12
Charged particle beam apparatus App 20020158198 - Kohama, Yoshiaki ; et al.	2002-10-31
Electron beam apparatus and device production method using the electron beam apparatus App 20020148961 - Nakasuji, Mamoru ; et al.	2002-10-17
Apparatus and method for inspecting predetermined region on surface of specimen using electron beam Grant 6,184,526 - Kohama , et al. February 6, 2	2001-02-06
Scanning electron microscope Grant 5,780,853 - Mori , et al. July 14, 1	1998-07-14
Charged particle microscope Grant 5,466,936 - Kohama , et al. November 14, 1	1995-11-14

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