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name:-0.020483016967773
name:-0.011255025863647
name:-0.0016231536865234
Kohama; Tatsuya Patent Filings

Kohama; Tatsuya

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kohama; Tatsuya.The latest application filed is for "adjustment method and electron beam device".

Company Profile
1.11.15
  • Kohama; Tatsuya - Tokyo JP
  • Kohama; Tatsuya - Kanagawa JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Adjustment method and electron beam device
Grant 11,217,421 - Hayashi , et al. January 4, 2
2022-01-04
Adjustment Method And Electron Beam Device
App 20210012997 - HAYASHI; Takehide ;   et al.
2021-01-14
Inspection device
Grant 10,157,722 - Hatakeyama , et al. Dec
2018-12-18
Inspection Device
App 20160307726 - Hatakeyama; Masahiro ;   et al.
2016-10-20
Electro-optical inspection apparatus and method with dust or particle collection function
Grant 9,105,444 - Watanabe , et al. August 11, 2
2015-08-11
Sample observing device and sample observing method
Grant 8,884,225 - Karimata , et al. November 11, 2
2014-11-11
Electro-optical Inspection Apparatus And Method With Dust Or Particle Collection Function
App 20140091215 - WATANABE; Kenji ;   et al.
2014-04-03
Inspection Device
App 20140014848 - Hatakeyama; Masahiro ;   et al.
2014-01-16
Electro-optical inspection apparatus and method with dust or particle collection function
Grant 8,624,182 - Watanabe , et al. January 7, 2
2014-01-07
Inspection device
Grant 8,497,476 - Hatakeyama , et al. July 30, 2
2013-07-30
Sample Observing Device And Sample Observing Method
App 20130161511 - Karimata; Tsutomu ;   et al.
2013-06-27
Inspection Device
App 20120235036 - Hatakeyama; Masahiro ;   et al.
2012-09-20
Electro-optical Inspection Apparatus And Method With Dust Or Particle Collection Function
App 20120074316 - WATANABE; Kenji ;   et al.
2012-03-29
Polishing method
Grant 7,960,188 - Ohta , et al. June 14, 2
2011-06-14
Polishing Method
App 20090286332 - OHTA; Shinrou ;   et al.
2009-11-19
Method For Polishing A Workpiece
App 20090142990 - KOHAMA; Tatsuya ;   et al.
2009-06-04
Substrate polishing apparatus and substrate polishing method
App 20070238395 - Kimura; Norio ;   et al.
2007-10-11
Polishing pad and polishing apparatus
App 20070135024 - Kobata; Itsuki ;   et al.
2007-06-14
Method and apparatus for polishing a workpiece
Grant 7,077,730 - Kohama , et al. July 18, 2
2006-07-18
Polishing apparatus and polishing method
App 20060105678 - Kohama; Tatsuya ;   et al.
2006-05-18
Method and apparatus for polishing a workpiece
App 20050020194 - Kohama, Tatsuya ;   et al.
2005-01-27
Polishing method and apparatus
Grant 6,663,469 - Kimura , et al. December 16, 2
2003-12-16
Substrate polishing apparatus and substrate polishing mehod
App 20020023715 - Kimura, Norio ;   et al.
2002-02-28
Polishing method and apparatus
App 20020002029 - Kimura, Norio ;   et al.
2002-01-03

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