Koguchi; Masanari

Patent Applications and Registrations

Patent applications and USPTO patent grants for Koguchi; Masanari.The latest application filed is for "substitution site measuring equipment and substitution site measuring method".

Company Profile

0.23.20

Koguchi; Masanari - Tokyo JP
Koguchi; Masanari - Kunitachi N/A JP
Koguchi; Masanari - Kodaira JP
Koguchi; Masanari - Higashikurume JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Substitution site measuring equipment and substitution site measuring method Grant 10,627,354 - Anan , et al.	2020-04-21
Substitution Site Measuring Equipment and Substitution Site Measuring Method App 20190017948 - ANAN; Yoshihiro ; et al.	2019-01-17
Method for evaluating structural change during production process, and analysis program Grant 10,088,450 - Nakayama , et al. October 2, 2	2018-10-02
Method For Evaluating Structural Change During Production Process, And Analysis Program App 20170315091 - NAKAYAMA; Takeshi ; et al.	2017-11-02
Charged-particle-beam analysis device and analysis method Grant 9,752,997 - Anan , et al. September 5, 2	2017-09-05
Spectroscopic element and charged particle beam device using the same Grant 9,601,308 - Anan , et al. March 21, 2	2017-03-21
Charged-particle-beam Analysis Device And Analysis Method App 20170067838 - ANAN; Yoshihiro ; et al.	2017-03-09
Spectroscopic Element And Charged Particle Beam Device Using The Same App 20150318144 - Anan; Yoshihiro ; et al.	2015-11-05
Calculation System And Calculation Method App 20150293040 - Aramaki; Koji ; et al.	2015-10-15
Charged particle beam analyzer and analysis method Grant 8,481,932 - Anan , et al. July 9, 2	2013-07-09
Multi-part specimen holder with conductive patterns Grant 8,334,519 - Ono , et al. December 18, 2	2012-12-18
Charged Particle Beam Analyzer And Analysis Method App 20120257720 - ANAN; Yoshihiro ; et al.	2012-10-11
Diffraction Pattern Capturing Method And Charged Particle Beam Device App 20110049344 - Dobashi; Takashi ; et al.	2011-03-03
Electric charged particle beam microscopy and electric charged particle beam microscope Grant 7,633,064 - Tsuneta , et al. December 15, 2	2009-12-15
Magnetic electron microscope Grant 7,518,111 - Matsumoto , et al. April 14, 2	2009-04-14
Magnetic Electron Microscope App 20090078869 - Matsumoto; Takao ; et al.	2009-03-26
Electron microscope App 20080283748 - Matsumoto; Takao ; et al.	2008-11-20
Scanning interference electron microscope Grant 7,417,227 - Matsumoto , et al. August 26, 2	2008-08-26
Scanning transmission electron microscope and scanning transmission electron microscopy Grant 7,372,029 - Tsuneta , et al. May 13, 2	2008-05-13
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system Grant 7,372,051 - Tsuneta , et al. May 13, 2	2008-05-13
Electric Charged Particle Beam Microscopy And Electric Charged Particle Beam Microscope App 20080093551 - TSUNETA; Ruriko ; et al.	2008-04-24
Specimen Analyzing Apparatus and Specimen Holder App 20080067374 - Ono; Shiano ; et al.	2008-03-20
Scanning transmission electron microscope and scanning transmission electron microscopy App 20070228277 - Tsuneta; Ruriko ; et al.	2007-10-04
Scanning transmission electron microscope and scanning transmission electron microscopy Grant 7,227,144 - Tsuneta , et al. June 5, 2	2007-06-05
Defect inspection instrument and positron beam apparatus Grant 7,141,790 - Koguchi , et al. November 28, 2	2006-11-28
Scanning transmission electron microscope and scanning transmission electron microscopy App 20060151701 - Tsuneta; Ruriko ; et al.	2006-07-13
Scanning interference electron microscope App 20060124850 - Matsumoto; Takao ; et al.	2006-06-15
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system App 20060038125 - Tsuneta; Ruriko ; et al.	2006-02-23
Electron microscope Grant 6,888,139 - Tsuneta , et al. May 3, 2	2005-05-03
Method and apparatus for charged particle beam microscopy Grant 6,838,667 - Tsuneta , et al. January 4, 2	2005-01-04
Defect inspection instrument and positron beam apparatus App 20040227078 - Koguchi, Masanari ; et al.	2004-11-18
Observation apparatus and observation method using an electron beam Grant 6,750,451 - Koguchi , et al. June 15, 2	2004-06-15
Electron microscope App 20030201393 - Tsuneta, Ruriko ; et al.	2003-10-30
Autoadjusting electron microscope Grant 6,570,156 - Tsuneta , et al. May 27, 2	2003-05-27
Observation apparatus and observation method using an electron beam App 20030006373 - Koguchi, Masanari ; et al.	2003-01-09
Network solution system of analysis and evaluation App 20020099573 - Koguchi, Masanari ; et al.	2002-07-25
Method and apparatus for charged particle beam microscopy App 20020056808 - Tsuneta, Ruriko ; et al.	2002-05-16
Electron microscope Grant 6,051,834 - Kakibayashi , et al. April 18, 2	2000-04-18
Scintillator device and image pickup apparatus using the same Grant 5,932,880 - Koguchi , et al. August 3, 1	1999-08-03
Electron microscope Grant 5,866,905 - Kakibayashi , et al. February 2, 1	1999-02-02
Electron microscope Grant 5,552,602 - Kakibayashi , et al. September 3, 1	1996-09-03
Semiconductor device using whiskers Grant 5,362,972 - Yazawa , et al. November 8, 1	1994-11-08

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