Patent | Date |
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Electro-static discharge protection device Grant 7,875,902 - Kodama , et al. January 25, 2 | 2011-01-25 |
MOS type semiconductor device having electrostatic discharge protection arrangement Grant 7,595,537 - Kodama , et al. September 29, 2 | 2009-09-29 |
Electro-static Discharge Protection Device App 20080277689 - Kodama; Noriyuki ;   et al. | 2008-11-13 |
Electro-static discharge protection device Grant 7,332,748 - Kodama , et al. February 19, 2 | 2008-02-19 |
MOS type semiconductor device having electrostatic discharge protection arrangement Grant 7,196,377 - Kodama , et al. March 27, 2 | 2007-03-27 |
Electrostatic discharge protection device Grant 7,109,533 - Kodama September 19, 2 | 2006-09-19 |
Multifinger-type electrostatic discharge protection element Grant 7,098,510 - Kodama , et al. August 29, 2 | 2006-08-29 |
Charged plate,CDM simulator and test method App 20060157703 - Kodama; Noriyuki ;   et al. | 2006-07-20 |
MOS type semiconductor device having electrostatic discharge protection arrangement App 20050275032 - Kodama, Noriyuki ;   et al. | 2005-12-15 |
MOS type semiconductor device having electrostatic discharge protection arrangement App 20050236672 - Kodama, Noriyuki ;   et al. | 2005-10-27 |
Multifinger-type electrostatic discharge protection element App 20050029540 - Kodama, Noriyuki ;   et al. | 2005-02-10 |
Electro-static discharge protection device App 20040136127 - Kodama, Noriyuki ;   et al. | 2004-07-15 |
Coaxial probe with cantilever and scanning micro-wave microscope including the same Grant 6,715,345 - Ookubo , et al. April 6, 2 | 2004-04-06 |
Electrostatic discharge protection device Grant 6,713,818 - Kodama March 30, 2 | 2004-03-30 |
Electrostatic discharge protection device App 20030218841 - Kodama, Noriyuki | 2003-11-27 |
Electrostatic discharge protection device App 20030179523 - Kodama, Noriyuki | 2003-09-25 |
Coaxial probe and scanning micro-wave microscope including the same App 20030034453 - Ookubo, Norio ;   et al. | 2003-02-20 |
Electrification quantity measurement apparatus, electrification quantity measurement method, static electricity discharge detection apparatus, and static electricity discharge detection method App 20020186016 - Kodama, Noriyuki | 2002-12-12 |
Semiconductor device having raised source-drains and method of fabricating the same Grant 6,137,149 - Kodama October 24, 2 | 2000-10-24 |
Method for fabricating a field effect transistor having elevated source/drain regions Grant 5,967,794 - Kodama October 19, 1 | 1999-10-19 |
Fabrication process of semiconductor device Grant 5,953,605 - Kodama September 14, 1 | 1999-09-14 |
Fabrication process of semiconductor device Grant 5,716,891 - Kodama February 10, 1 | 1998-02-10 |
Manufacturing method of active circuit elements integrated type liquid crystal display Grant 5,541,119 - Kodama July 30, 1 | 1996-07-30 |
Coin discriminating apparatus Grant 5,458,225 - Iwamoto , et al. October 17, 1 | 1995-10-17 |