Kodama; Nobumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kodama; Nobumi.The latest application filed is for "semiconductor memory and burn-in test method of semiconductor memory".

Company Profile

0.8.2

Kodama; Nobumi - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor memory and burn-in test method of semiconductor memory Grant 7,200,059 - Fujioka , et al. April 3, 2	2007-04-03
Semiconductor memory and burn-in test method of semiconductor memory App 20060291307 - Fujioka; Shinya ; et al.	2006-12-28
Test apparatus for semiconductor device Grant 7,107,504 - Sato , et al. September 12, 2	2006-09-12
Test apparatus for semiconductor device App 20030002365 - Sato, Masahiro ; et al.	2003-01-02
Semiconductor dynamic memory device having improved refreshing Grant 4,787,067 - Takemae , et al. November 22, 1	1988-11-22
Semiconductor integrated circuit having function for switching operational mode of internal circuit Grant 4,771,407 - Takemae , et al. September 13, 1	1988-09-13
Semiconductor integrated circuit having function for switching operational mode of internal circuit Grant 4,742,486 - Takemae , et al. May 3, 1	1988-05-03
Semiconductor memory device Grant 4,740,926 - Takemae , et al. April 26, 1	1988-04-26
Semiconductor memory device having a circuit for compensating for discriminating voltage of memory cells Grant 4,716,549 - Nakano , et al. December 29, 1	1987-12-29
Booster circuit Grant 4,704,706 - Nakano , et al. November 3, 1	1987-11-03

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