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Patent applications and USPTO patent grants for Kobori; Takashi.The latest application filed is for "contact probe pin".
Patent | Date |
---|---|
Contact probe pin Grant 9,625,492 - Hirano , et al. April 18, 2 | 2017-04-18 |
Contact probe having carbon film on surface thereof Grant 9,116,173 - Hirano , et al. August 25, 2 | 2015-08-25 |
Contact Probe Pin App 20130222005 - Hirano; Takayuki ;   et al. | 2013-08-29 |
Contact Probe App 20130049784 - Hirano; Takayuki ;   et al. | 2013-02-28 |
Method and apparatus for forming thin film Grant 7,897,025 - Inoue , et al. March 1, 2 | 2011-03-01 |
Method For Forming Thin Film App 20090098311 - AOMINE; Nobutaka ;   et al. | 2009-04-16 |
Surface-treatment method and equipment Grant 7,459,187 - Hayashi , et al. December 2, 2 | 2008-12-02 |
Semiconductor device and method for manufacturing multilayered substrate for semiconductor device Grant 7,285,479 - Tachibana , et al. October 23, 2 | 2007-10-23 |
Surface-treatment method and equipment App 20070134414 - Hayashi; Kazushi ;   et al. | 2007-06-14 |
Semiconductor device and method for manufacturing multilayered substrate for semiconductor device App 20060175293 - Tachibana; Takeshi ;   et al. | 2006-08-10 |
Heat spreader and semiconductor device and package using the same Grant 7,067,903 - Tachibana , et al. June 27, 2 | 2006-06-27 |
Method and apparatus for forming thin film App 20050136694 - Inoue, Kenichi ;   et al. | 2005-06-23 |
Fine structure composite and drying method of fine structure using the same App 20050051930 - Kawakami, Nobuyuki ;   et al. | 2005-03-10 |
Heat spreader and semiconductor device and package using the same App 20040238946 - Tachibana, Takeshi ;   et al. | 2004-12-02 |
Fine structure composite and drying method of fine structure using the same App 20040038060 - Kawakami, Nobuyuki ;   et al. | 2004-02-26 |
Method of inspecting abnormality occurring inside pipe and apparatus for practicing the method Grant 5,773,984 - Suyama , et al. June 30, 1 | 1998-06-30 |
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