loadpatents
name:-0.020514965057373
name:-0.016141891479492
name:-0.00046396255493164
Kobayashi; Heiji Patent Filings

Kobayashi; Heiji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kobayashi; Heiji.The latest application filed is for "manufacturing method of vertical channel transistor array".

Company Profile
0.13.14
  • Kobayashi; Heiji - Hsinchu TW
  • Kobayashi; Heiji - Hsinchu City TW
  • Kobayashi; Heiji - Tokyo JP
  • Kobayashi; Heiji - Hyogo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for fabricating bottom electrode of capacitors of DRAM
Grant 8,846,485 - Kobayashi , et al. September 30, 2
2014-09-30
Manufacturing method of vertical channel transistor array
Grant 8,536,008 - Kobayashi , et al. September 17, 2
2013-09-17
Manufacturing Method Of Vertical Channel Transistor Array
App 20130130471 - Kobayashi; Heiji ;   et al.
2013-05-23
Vertical channel transistor array and manufacturing method thereof
Grant 8,390,062 - Kobayashi , et al. March 5, 2
2013-03-05
Vertical Channel Transistor Array And Manufacturing Method Thereof
App 20120018801 - Kobayashi; Heiji ;   et al.
2012-01-26
Method For Fabricating Bottom Electrode Of Capacitors Of Dram
App 20120015494 - Kobayashi; Heiji ;   et al.
2012-01-19
Method Of Manufacturing Semiconductor Device Capable Of Suppressing Impurity Concentration Reduction In Doped Channel Region Arising From Formation Of Gate Insulating Film
App 20100190306 - Tanaka; Yoshinori ;   et al.
2010-07-29
Method of manufacturing semiconductor device capable of suppressing impurity concentration reduction in doped channel region arising from formation of gate insulating film
Grant 7,691,713 - Tanaka , et al. April 6, 2
2010-04-06
Method Of Manufacturing Semiconductor Device Capable Of Suppressing Impurity Concentration Reduction In Doped Channel Region Arising From Formation Of Gate Insulting Film
App 20070243687 - Tanaka; Yoshinori ;   et al.
2007-10-18
Method of manufacturing semiconductor device capable of suppressing impurity concentration reduction in doped channel region arising from formation of gate insulating film
Grant 7,244,655 - Tanaka , et al. July 17, 2
2007-07-17
Method of manufacturing semiconductor device capable of suppressing impurity concentration reduction in doped channel region arising from formation of gate insulating film
App 20060079061 - Tanaka; Yoshinori ;   et al.
2006-04-13
Method of manufacturing semiconductor device capable of suppressing impurity concentration reduction in doped channel region arising from formation of gate insulating film
Grant 6,998,319 - Tanaka , et al. February 14, 2
2006-02-14
Semiconductor device and method of manufacturing the same
Grant 6,864,580 - Nakazawa , et al. March 8, 2
2005-03-08
Method of manufacturing semiconductor device capable of suppressing impurity concentration reduction in doped channel region arising from formation of gate insulating film
App 20040235255 - Tanaka, Yoshinori ;   et al.
2004-11-25
Method of fabricating a semiconductor device with a passivation film
Grant 6,815,265 - Nakatani , et al. November 9, 2
2004-11-09
Semiconductor chip mounting wafer
App 20030160303 - Hirokawa, Taichi ;   et al.
2003-08-28
Semiconductor device and method of fabricating the same
App 20030146514 - Nakatani, Shinya ;   et al.
2003-08-07
Semiconductor device and fabrication process therefor
App 20030073280 - Kobayashi, Heiji ;   et al.
2003-04-17
Method of manufacturing semiconductor device and semiconductor device
App 20030008499 - Kobayashi, Heiji
2003-01-09
Test system and test method of semiconductor device
App 20020109522 - Kobayashi, Heiji ;   et al.
2002-08-15
Semiconductor device and method of manufacturing the same
App 20020096769 - Nakazawa, Shoichiro ;   et al.
2002-07-25
Semiconductor device and fabrication process therefor
App 20020098686 - Kobayashi, Heiji ;   et al.
2002-07-25
Semiconductor device and manufacturing method thereof
Grant 6,215,187 - Ooto , et al. April 10, 2
2001-04-10
Method of manufacturing semiconductor device with retrograde wells
Grant 5,478,759 - Mametani , et al. December 26, 1
1995-12-26
Snowmobile
Grant D278,892 - Kobayashi May 21, 1
1985-05-21

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