Ko; Woo-seok

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ko; Woo-seok.The latest application filed is for "method of inspecting wafer using electron beam".

Company Profile

1.18.22

Ko; Woo-seok - Seoul KR
Ko; Woo-Seok - Yongin-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of inspecting wafer using electron beam Grant 10,373,796 - Kim , et al.	2019-08-06
Surface inspecting method Grant 10,001,444 - Ko , et al. June 19, 2	2018-06-19
Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof Grant 9,934,939 - Kim , et al. April 3, 2	2018-04-03
Broadband light source and optical inspector having the same Grant 9,831,626 - Ryu , et al. November 28, 2	2017-11-28
Spectral ellipsometry measurement and data analysis device and related systems and methods Grant 9,733,178 - Ryu , et al. August 15, 2	2017-08-15
Apparatus and method for inspection of substrate defect Grant 9,678,020 - Song , et al. June 13, 2	2017-06-13
Method of Inspecting Wafer Using Electron Beam App 20160293379 - Kim; Souk ; et al.	2016-10-06
Overlay measuring method and system, and method of manufacturing semiconductor device using the same Grant 9,455,206 - Yun , et al. September 27, 2	2016-09-27
Wafer Inspection Apparatus Using Three-Dimensional Image App 20160261786 - Ahn; Jeong-ho ; et al.	2016-09-08
Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film Grant 9,417,055 - Ryu , et al. August 16, 2	2016-08-16
Method And System For Detecting Defects App 20160189369 - JUNG; Jae-Ouk ; et al.	2016-06-30
Surface Inspecting Method App 20160153915 - Ko; Kang-woong ; et al.	2016-06-02
Broadband Light Source And Optical Inspector Having The Same App 20160097513 - RYU; Sung-Yoon ; et al.	2016-04-07
Apparatus For Measuring Thickness Of Thin Film, System Including The Apparatus, And Method For Measuring Thickness Of Thin Film App 20160061583 - RYU; Sung-Yoon ; et al.	2016-03-03
Conductive atomic force microscope and method of operating the same Grant 9,261,532 - Kim , et al. February 16, 2	2016-02-16
Reflector structure of illumination optic system Grant 9,255,694 - Joo , et al. February 9, 2	2016-02-09
Conductive Atomic Force Microscope And Method Of Operating The Same App 20160033550 - KIM; Hyun-woo ; et al.	2016-02-04
Apparatus And Method For Inspection Of Substrate Defect App 20160025654 - SONG; Joon-Seo ; et al.	2016-01-28
Spectral Ellipsometry Measurement and Data Analysis Device and Related Systems and Methods App 20160025618 - Ryu; Sung-Yoon ; et al.	2016-01-28
Overlay Measuring Method And System, And Method Of Manufacturing Semiconductor Device Using The Same App 20160013109 - YUN; Seong-Jin ; et al.	2016-01-14
Methods of fabricating microelectronic substrate inspection equipment Grant 9,123,503 - Kim , et al. September 1, 2	2015-09-01
Scanning Electron Microscope System Capable Of Measuring In-cell Overlay Offset Using High-energy Electron Beam And Method Thereof App 20150115154 - Kim; Min Kook ; et al.	2015-04-30
Broadband light illuminators Grant 8,841,824 - Ko , et al. September 23, 2	2014-09-23
Methods Of Fabricating Microelectronic Substrate Inspection Equipment App 20140224987 - KIM; Min-Kook ; et al.	2014-08-14
Microelectronic substrate inspection equipment using helium ion microscopy Grant 8,729,468 - Kim , et al. May 20, 2	2014-05-20
System And Method For Providing Light App 20130214180 - JOO; Won Don ; et al.	2013-08-22
Reflector Structure Of Illumination Optic System App 20130208486 - JOO; Won-Don ; et al.	2013-08-15
Microelectronic Substrate Inspection Equipment Using Helium Ion Microscopy App 20130175445 - Kim; Min-Kook ; et al.	2013-07-11
Broadband Light Illuminators App 20130169140 - KO; Woo-Seok ; et al.	2013-07-04
Method for inspection of defects on a substrate Grant 8,034,641 - Ko , et al. October 11, 2	2011-10-11
Method For Inspection Of Defects On A Substrate App 20110097829 - KO; Woo-seok ; et al.	2011-04-28
Apparatus and method for inspecting a surface of a wafer Grant 7,697,130 - Ko , et al. April 13, 2	2010-04-13
Apparatus And Method For Inspecting A Surface Of A Wafer App 20090219520 - Ko; Woo-Seok ; et al.	2009-09-03

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