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Patent applications and USPTO patent grants for Knowlton; Dennis J..The latest application filed is for "chemical mechanical planarization (cmp) slurry quality control process and particle size distribution measuring systems".
Patent | Date |
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Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems Grant RE39,783 - Cerni , et al. August 21, 2 | 2007-08-21 |
Particle detection system utilizing an inviscid flow-producing nozzle Grant 5,861,950 - Knowlton January 19, 1 | 1999-01-19 |
Noise reduction utilizing signal multiplication Grant 5,805,281 - Knowlton , et al. September 8, 1 | 1998-09-08 |
Device and method for optically detecting particles in a free liquid stream Grant 5,671,046 - Knowlton September 23, 1 | 1997-09-23 |
Pulse code modulation radio control system Grant 4,038,590 - Knowlton July 26, 1 | 1977-07-26 |
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